LMG3526R030
- 650-V GaN-on-Si FET with integrated gate driver
- Integrated high precision gate bias voltage
- 200-V/ns FET hold-off
- 2-MHz switching frequency
- 20-V/ns to 150-V/ns slew rate for optimization of switching performance and EMI mitigation
- Operates from 7.5-V to 18-V supply
- Robust protection
- Cycle-by-cycle overcurrent and latched short-circuit protection with < 100-ns response
- Withstands 720-V surge while hard-switching
- Self-protection from internal overtemperature and UVLO monitoring
- Advanced power management
- Digital temperature PWM output
- Top-side cooled 12-mm × 12-mm VQFN package separates electrical and thermal paths for lowest power loop inductance
- Zero voltage detection feature that facilitates soft-switching converters
The LMG3526R030 GaN FET with integrated driver and protections is targeting switch-mode power converters and enables designers to achieve new levels of power density and efficiency.
The LMG3526R030 integrates a silicon driver that enables switching speed up to 150 V/ns. TI’s integrated precision gate bias results in higher switching SOA compared to discrete silicon gate drivers. This integration, combined with TIs low-inductance package, delivers clean switching and minimal ringing in hard-switching power supply topologies. Adjustable gate drive strength allows control of the slew rate from 20 V/ns to 150 V/ns, which can be used to actively control EMI and optimize switching performance.
Advanced features include digital temperature reporting, fault detection and zero voltage detection. The temperature of the GaN FET is reported through a variable duty cycle PWM output. Faults reported include overtemperature, overcurrent, and UVLO monitoring. Zero-voltage detection (ZVD) feature can provide a pulse output from ZVD pin when zero-voltage switching is realized.
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功能与比较器件相同且具有相同引脚。
Standard version without zero-voltage switching detection feature
技术文档
类型 | 项目标题 | 下载最新的英语版本 | 日期 | |||
---|---|---|---|---|---|---|
* | 数据表 | LMG3526R030 650-V 30-mΩ GaN FET With Integrated Driver, Protection, and Temperature Reporting 数据表 | PDF | HTML | 2023年 3月 13日 | ||
更多文献资料 | 实现 GaN 产品的寿命可靠性 | 下载英文版本 | PDF | HTML | 2021年 10月 11日 | ||
更多文献资料 | 汽车 650V GaN 功率级顶部冷却 QFN 12x12 封装的热设计和性能 | 下载英文版本 | 2021年 10月 11日 |
设计和开发
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LMG342X-BB-EVM — 适用于 LMG342x 系列的 LMG342x GaN 系统级评估主板
仅需要一个脉宽调制输入,即可在电路板上生成互补的脉宽调制信号和相应的死区时间。提供了探测点,从而可使用具有短接地弹簧的示波器探针测量关键逻辑和功率级波形。
LMG3522EVM-042 — LMG3522R030-Q1 具有集成驱动器子卡的汽车类 650V 30mΩ GaN FET
LMG3522EVM-042 在半桥中配置两个 LMG3522R030 GaN FET,具有逐周期过流保护、短路锁存保护功能和所有必要的辅助外围电路。该 EVM 旨在与大型系统配合使用。
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封装 | 引脚数 | 下载 |
---|---|---|
VQFN (RQS) | 52 | 了解详情 |
订购和质量
- RoHS
- REACH
- 器件标识
- 引脚镀层/焊球材料
- MSL 等级/回流焊峰值温度
- MTBF/时基故障估算
- 材料成分
- 认证摘要
- 持续可靠性监测
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