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This document contains information for DRV8705-Q1 (VQFN 32 pin package package) to aid in a functional safety system design. Information provided are:
Figure 1-1 shows the device functional block diagram for the SPI variant as a reference.
Figure 1-2 shows the device functional block diagram for the HW variant as a reference.
DRV8705-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.
This section provides Functional Safety Failure In Time (FIT) rates for DRV8705-Q1 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total Component FIT Rate | 20 |
Die FIT Rate | 3 |
Package FIT Rate | 17 |
The failure rate and mission profile information in Table 2-1 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS,
BICMOS Digital, analog / mixed | 60 FIT | 70°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.
The failure mode distribution estimation for DRV8705-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
Low side gate turned ON, when commanded OFF | 12.0% |
Low side gate turned OFF, when commanded ON | 12.5% |
Low side gate to source voltage too high or too low | 4.0% |
Low side gate driver slew rate too fast or too slow | 3.0% |
High side gate turned ON, when commanded OFF | 13.5% |
High side gate turned OFF, when commanded ON | 16.0% |
High side gate to source voltage too high or too low | 4.0% |
High side gate driver slew rate too fast or too slow | 3.0% |
Dead time between high side FET and low side FET transition incorrect | 5.5% |
Current sense feedback and regulation incorrect | 10.0% |
Drain Source voltage monitoring incorrect | 6.5% |
Incorrect communication or fault indication | 10.0% |
This section provides a Failure Mode Analysis (FMA) for the pins of the DRV8705-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-9 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality |
B | No device damage, but loss of functionality |
C | No device damage, but performance degradation |
D | No device damage, no impact to functionality or performance |
Figure 4-1 and Figure 4-2 show the DRV8705-Q1 pin diagrams. The DRV8705-Q1 has two pin diagram variants, an SPI variant (DRV8705S-Q1) and a HW variant (DRV8705H-Q1). For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the DRV8705-Q1 data sheet.
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
GND | 1 | No impact. Intended operation. | D |
DVDD | 2 | Device external digital power supply stuck low. Device non-operational. | B |
nSCS | 3 | SPI communication compromised. | B |
SCLK | 4 | SPI communication compromised. | B |
SDI | 5 | SPI communication compromised. | B |
SDO | 6 | SPI communication compromised. | B |
IN1/EN | 7 | Gate driver control input stuck low. Driver output may not match input. | B |
nHIZ1 | 8 | Gate driver control input stuck low. Driver output disabled. | B |
IN2/PH | 9 | Gate driver control input stuck low. Driver output may not match input. | B |
nHIZ2 | 10 | Gate driver control input stuck low. Driver output disabled. | B |
nSLEEP | 11 | Device stuck in sleep state. Outputs non-operational. | B |
DRVOFF | 12 | Driver disable input stuck low. Gate driver disable function non-operational. | B |
nFAULT | 13 | Device fault output indicator always active. | B |
SO | 14 | Device current sense feedback invalid. | B |
RSVD | 15 | No impact. Intended operation. | D |
AREF | 16 | Device external analog power supply stuck low. Current sense invalid. | B |
AGND | 17 | No impact. Intended operation. | D |
SP | 18 | Device current sense feedback invalid. | B |
SN | 19 | Device current sense feedback invalid. | B |
GH1 | 20 | HS1 external MOSFET off, energy limited by TDRIVE. Device VGS fault. | B |
SH1 | 21 | HS1 external MOSFET non-operational. Device VDS fault. | B |
GL1 | 22 | LS1 external MOSFET off, energy limited by TDRIVE. Device VGS fault. | B |
SL1 | 23 | No impact. Intended operation. | D |
SL2 | 24 | No impact. Intended operation. | D |
GL2 | 25 | LS2 external MOSFET off, energy limited by TDRIVE. Device VGS fault. | B |
SH2 | 26 | HS2 external MOSFET non-operational. Device VDS fault. | B |
GH2 | 27 | HS2 external MOSFET off, energy limited by TDRIVE. Device VGS fault. | B |
DRAIN | 28 | Device overcurrent monitors and open load diagnostic non-operational. | B |
PVDD | 29 | Device external power supply stuck low. Device gate drivers and shunt amplifier non-operational. | B |
VCP | 30 | Device charge pump non-operational. Device CPUV fault. | A |
CPH | 31 | Device charge pump non-operational. Device CPUV fault. | A |
CPL | 32 | Device charge pump non-operational. Device CPUV fault. | A |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
GND | 1 | No impact. Intended operation. | D |
DVDD | 2 | Device external digital power supply stuck low. Device non-operational. | B |
GAIN | 3 | Device GAIN setting potentially incorrect. | B |
VDS | 4 | Device VDS setting potentially incorrect. | B |
IDRIVE | 5 | Device IDRIVE setting potentially incorrect. | B |
MODE | 6 | Device MODE setting potentially incorrect. | B |
IN1/EN | 7 | Gate driver control input stuck low. Driver output may not match input. | B |
nHIZ1 | 8 | Gate driver control input stuck low. Driver output disabled. | B |
IN2/PH | 9 | Gate driver control input stuck low. Driver output may not match input. | B |
nHIZ2 | 10 | Gate driver control input stuck low. Driver output disabled. | B |
nSLEEP | 11 | Device stuck in sleep state. Outputs non-operational. | B |
DRVOFF | 12 | Driver disable input stuck low. Gate driver disable function non-operational. | B |
nFAULT | 13 | Device fault output indicator always active. | B |
SO | 14 | Device current sense feedback invalid. | B |
RSVD | 15 | No impact. Intended operation. | D |
AREF | 16 | Device external analog power supply stuck low. Current sense invalid. | B |
AGND | 17 | No impact. Intended operation. | D |
SP | 18 | Device current sense feedback invalid. | B |
SN | 19 | Device current sense feedback invalid. | B |
GH1 | 20 | HS1 external MOSFET off, energy limited by TDRIVE. Device VGS fault. | B |
SH1 | 21 | HS1 external MOSFET non-operational. Device VDS fault. | B |
GL1 | 22 | LS1 external MOSFET off, energy limited by TDRIVE. Device VGS fault. | B |
SL1 | 23 | No impact. Intended operation. | D |
SL2 | 24 | No impact. Intended operation. | D |
GL2 | 25 | LS2 external MOSFET off, energy limited by TDRIVE. Device VGS fault. | B |
SH2 | 26 | HS2 external MOSFET non-operational. Device VDS fault. | B |
GH2 | 27 | HS2 external MOSFET off, energy limited by TDRIVE. Device VGS fault. | B |
DRAIN | 28 | Device overcurrent monitors and open load diagnostic non-operational. | B |
PVDD | 29 | Device external power supply stuck low. Device gate drivers and shunt amplifier non-operational. | B |
VCP | 30 | Device charge pump non-operational. Device CPUV fault. | A |
CPH | 31 | Device charge pump non-operational. Device CPUV fault. | A |
CPL | 32 | Device charge pump non-operational. Device CPUV fault. | A |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
GND | 1 | Device behavior undefined, may retain operation due to alternative AGND pin path. | C |
DVDD | 2 | Device external digital power supply missing. Device non-operational. | B |
nSCS | 3 | SPI communication compromised. | B |
SCLK | 4 | SPI communication compromised. | B |
SDI | 5 | SPI communication compromised. | B |
SDO | 6 | SPI communication compromised. | B |
IN1/EN | 7 | Gate driver control input pulled low. Driver output may not match input. | B |
nHIZ1 | 8 | Gate driver control input pulled low. Driver output disabled. | B |
IN2/PH | 9 | Gate driver control input pulled low. Driver output may not match input. | B |
nHIZ2 | 10 | Gate driver control input pulled low. Driver output disabled. | B |
nSLEEP | 11 | Device stuck in sleep state. Outputs non-operational. | B |
DRVOFF | 12 | Driver disable input pulled low. Gate driver disable function non-operational. | B |
nFAULT | 13 | Device fault output indicator invalid. | B |
SO | 14 | Device current sense feedback invalid. | B |
RSVD | 15 | No impact. Intended operation. | D |
AREF | 16 | Device external analog power supply missing. Current sense invalid. | B |
AGND | 17 | Device behavior undefined, may retain operation due to alternative GND pin path. | C |
SP | 18 | Device current sense feedback invalid. | B |
SN | 19 | Device current sense feedback invalid. | B |
GH1 | 20 | HS1 external MOSFET non-operational. | B |
SH1 | 21 | HS1 external MOSFET non-operational. Device VDS fault. | B |
GL1 | 22 | LS1 external MOSFET non-operational. | B |
SL1 | 23 | LS1 VDS monitor non-operational. | B |
SL2 | 24 | LS2 VDS monitor non-operational. | B |
GL2 | 25 | LS2 external MOSFET non-operational. | B |
SH2 | 26 | HS2 external MOSFET non-operational. Device VDS fault. | B |
GH2 | 27 | HS2 external MOSFET non-operational. | B |
DRAIN | 28 | HS1 and HS2 VDS monitors and open load diagnostics non-operational. | B |
PVDD | 29 | Device external power supply missing. Device gate drivers and shunt amplifier non-operational. | B |
VCP | 30 | Device charge pump non-operational. Device CPUV fault. | B |
CPH | 31 | Device charge pump non-operational. Device CPUV fault. | B |
CPL | 32 | Device charge pump non-operational. Device CPUV fault. | B |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
GND | 1 | Device behavior undefined, may retain operation due to alternative AGND pin path. | C |
DVDD | 2 | Device external digital power supply missing. Device non-operational. | B |
GAIN | 3 | Device GAIN setting fixed to level 3. | B |
VDS | 4 | Device VDS setting fixed to level 4. | B |
IDRIVE | 5 | Device IDRIVE setting fixed to level 4. | B |
MODE | 6 | Device MODE setting fixed to level 3. | B |
IN1/EN | 7 | Gate driver control input pulled low. Driver output may not match input. | B |
nHIZ1 | 8 | Gate driver control input pulled low. Driver output disabled. | B |
IN2/PH | 9 | Gate driver control input pulled low. Driver output may not match input. | B |
nHIZ2 | 10 | Gate driver control input pulled low. Driver output disabled. | B |
nSLEEP | 11 | Device stuck in sleep state. Outputs non-operational. | B |
DRVOFF | 12 | Driver disable input pulled low. Gate driver disable function non-operational. | B |
nFAULT | 13 | Device fault output indicator invalid. | B |
SO | 14 | Device current sense feedback invalid. | B |
RSVD | 15 | No impact. Intended operation. | D |
AREF | 16 | Device external analog power supply missing. Current sense invalid. | B |
AGND | 17 | Device behavior undefined, may retain operation due to alternative GND pin path. | C |
SP | 18 | Device current sense feedback invalid. | B |
SN | 19 | Device current sense feedback invalid. | B |
GH1 | 20 | HS1 external MOSFET non-operational. | B |
SH1 | 21 | HS1 external MOSFET non-operational. Device VDS fault. | B |
GL1 | 22 | LS1 external MOSFET non-operational. | B |
SL1 | 23 | LS1 VDS monitor non-operational. | B |
SL2 | 24 | LS2 VDS monitor non-operational. | B |
GL2 | 25 | LS2 external MOSFET non-operational. | B |
SH2 | 26 | HS2 external MOSFET non-operational. Device VDS fault. | B |
GH2 | 27 | HS2 external MOSFET non-operational. | B |
DRAIN | 28 | HS1 and HS2 VDS monitors and open load diagnostics non-operational. | B |
PVDD | 29 | Device external power supply missing. Device gate drivers and shunt amplifier non-operational. | B |
VCP | 30 | Device charge pump non-operational. Device CPUV fault. | B |
CPH | 31 | Device charge pump non-operational. Device CPUV fault. | B |
CPL | 32 | Device charge pump non-operational. Device CPUV fault. | B |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
GND | 1 | Device external digital power supply stuck low. Device non-operational. | B |
DVDD | 2 | SPI communication compromised. | B |
nSCS | 3 | SPI communication compromised. | B |
SCLK | 4 | SPI communication compromised. | B |
SDI | 5 | SPI communication compromised. | B |
SDO | 6 | SPI communication compromised. Gate driver control input mismatch. | B |
IN1/EN | 7 | Gate driver control input mismatch. | B |
nHIZ1 | 8 | Gate driver control input mismatch. | B |
IN2/PH | 9 | Gate driver control input mismatch. | B |
nHIZ2 | 10 | Gate driver control input mismatch. Device may enter sleep state. | B |
nSLEEP | 11 | Device may enter sleep state or disable gate drivers. | B |
DRVOFF | 12 | Device may disable gate driver or fault output indicator invalid. | B |
nFAULT | 13 | Device fault indicator or current sense invalid. | B |
SO | 14 | No impact. Intended operation. | D |
RSVD | 15 | No impact. Intended operation. | D |
AREF | 16 | Device external analog power supply stuck low. Current sense invalid. | B |
AGND | 17 | Current sense invalid. | B |
SP | 18 | Current sense invalid. | B |
SN | 19 | Current sense invalid and HS1 external MOSFET off, energy limited by TDRIVE. Device VGS fault | B |
GH1 | 20 | HS1 external MOSFET off, energy limited by TDRIVE. Device VGS fault | B |
SH1 | 21 | GL1 output invalid, may violate GL1 voltage rating. | A |
GL1 | 22 | LS1 external MOSFET off, energy limited by TDRIVE. Device VGS fault. | B |
SL1 | 23 | Low-side VDS monitor sense accuracy impacted. | C |
SL2 | 24 | LS2 external MOSFET off, energy limited by TDRIVE. Device VGS fault. | B |
GL2 | 25 | GL2 output invalid, may violate GL1 voltage rating. | A |
SH2 | 26 | HS2 external MOSFET off, energy limited by TDRIVE. Device VGS fault. | B |
GH2 | 27 | HS2 external MOSFET off, energy limited by TDRIVE. Device VGS fault. | B |
DRAIN | 28 | High-side VDS monitor sense accuracy impact. | C |
PVDD | 29 | Device charge pump non-operational. Device CPUV fault. | B |
VCP | 30 | Device charge pump non-operational. Device CPUV fault. | B |
CPH | 31 | Device charge pump non-operational. Device CPUV fault. | A |
CPL | 32 | Device charge pump non-operational. Device CPUV fault. | A |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
GND | 1 | Device external digital power supply stuck low. Device non-operational. | B |
DVDD | 2 | Device GAIN setting potentially incorrect. | B |
GAIN | 3 | Device GAIN and VDS setting potentially incorrect. | B |
VDS | 4 | Device VDS and IDRIVE setting potentially incorrect. | B |
IDRIVE | 5 | Device IDRIVE and MODE setting potentially incorrect. | B |
MODE | 6 | Device MODE setting potentially incorrect and gate driver control input mismatch. | B |
IN1/EN | 7 | Gate driver control input mismatch. | B |
nHIZ1 | 8 | Gate driver control input mismatch. | B |
IN2/PH | 9 | Gate driver control input mismatch. | B |
nHIZ2 | 10 | Gate driver control input mismatch. Device may enter sleep state. | B |
nSLEEP | 11 | Device may enter sleep state or disable gate drivers. | B |
DRVOFF | 12 | Device may disable gate driver or fault output indicator invalid. | B |
nFAULT | 13 | Device fault indicator or current sense invalid. | B |
SO | 14 | No impact. Intended operation. | D |
RSVD | 15 | No impact. Intended operation. | D |
AREF | 16 | Device external analog power supply stuck low. Current sense invalid. | B |
AGND | 17 | Current sense invalid. | B |
SP | 18 | Current sense invalid. | B |
SN | 19 | Current sense invalid and HS1 external MOSFET off, energy limited by TDRIVE. Device VGS fault | B |
GH1 | 20 | HS1 external MOSFET off, energy limited by TDRIVE. Device VGS fault | B |
SH1 | 21 | GL1 output invalid, may violate GL1 voltage rating. | A |
GL1 | 22 | LS1 external MOSFET off, energy limited by TDRIVE. Device VGS fault. | B |
SL1 | 23 | Low-side VDS monitor sense accuracy impacted. | C |
SL2 | 24 | LS2 external MOSFET off, energy limited by TDRIVE. Device VGS fault. | B |
GL2 | 25 | GL2 output invalid, may violate GL1 voltage rating. | A |
SH2 | 26 | HS2 external MOSFET off, energy limited by TDRIVE. Device VGS fault. | B |
GH2 | 27 | HS2 external MOSFET off, energy limited by TDRIVE. Device VGS fault. | B |
DRAIN | 28 | High-side VDS monitor sense accuracy impact. | C |
PVDD | 29 | Device charge pump non-operational. Device CPUV fault. | B |
VCP | 30 | Device charge pump non-operational. Device CPUV fault. | B |
CPH | 31 | Device charge pump non-operational. Device CPUV fault. | A |
CPL | 32 | Device charge pump non-operational. Device CPUV fault. | A |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
GND | 1 | Device external power supply stuck low. Device gate drivers and shunt amplifier non-operational. | B |
DVDD | 2 | Low voltage pin max voltage violated. | A |
nSCS | 3 | Low voltage pin max voltage violated. | A |
SCLK | 4 | Low voltage pin max voltage violated. | A |
SDI | 5 | Low voltage pin max voltage violated. | A |
SDO | 6 | Low voltage pin max voltage violated. | A |
IN1/EN | 7 | Low voltage pin max voltage violated. | A |
nHIZ1 | 8 | Low voltage pin max voltage violated. | A |
IN2/PH | 9 | Low voltage pin max voltage violated. | A |
nHIZ2 | 10 | Low voltage pin max voltage violated. | A |
nSLEEP | 11 | Low voltage pin max voltage violated. | A |
DRVOFF | 12 | Low voltage pin max voltage violated. | A |
nFAULT | 13 | Low voltage pin max voltage violated. | A |
SO | 14 | Low voltage pin max voltage violated. | A |
RSVD | 15 | No impact. Intended operation. | D |
AREF | 16 | Low voltage pin max voltage violated. | A |
AGND | 17 | Device external power supply stuck low. Device gate drivers and shunt amplifier non-operational. | B |
SP | 18 | Current sense invalid. | B |
SN | 19 | Current sense invalid. | B |
GH1 | 20 | HS1 external MOSFET gate stuck high, energy limited by TDRIVE. Device VGS fault. | B |
SH1 | 21 | LS1 external MOSFET non-operational. Device VDS fault. | B |
GL1 | 22 | LS1 external MOSFET gate stuck high, energy limited by TDRIVE. Device VGS fault. May violate GL1 voltage rating. | A |
SL1 | 23 | Device external power supply stuck low. Device gate drivers and shunt amplifier non-operational. | B |
SL2 | 24 | Device external power supply stuck low. Device gate drivers and shunt amplifier non-operational. | B |
GL2 | 25 | LS1 external MOSFET gate stuck high, energy limited by TDRIVE. Device VGS fault. May violate GL1 voltage rating. | A |
SH2 | 26 | LS2 external MOSFET non-operational. Device VDS fault. | B |
GH2 | 27 | HS2 external MOSFET gate stuck high, energy limited by TDRIVE. Device VGS fault. | B |
DRAIN | 28 | High-side VDS monitor sense accuracy impact. | B |
PVDD | 29 | No impact. Intended operation. | D |
VCP | 30 | Device charge pump non-operational. Device CPUV fault. | B |
CPH | 31 | Device charge pump non-operational. Device CPUV fault. | B |
CPL | 32 | Device charge pump non-operational. Device CPUV fault. | A |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
GND | 1 | Device external power supply stuck low. Device gate drivers and shunt amplifier non-operational. | B |
DVDD | 2 | Low voltage pin max voltage violated. | A |
GAIN | 3 | Low voltage pin max voltage violated. | A |
VDS | 4 | Low voltage pin max voltage violated. | A |
IDRIVE | 5 | Low voltage pin max voltage violated. | A |
MODE | 6 | Low voltage pin max voltage violated. | A |
IN1/EN | 7 | Low voltage pin max voltage violated. | A |
nHIZ1 | 8 | Low voltage pin max voltage violated. | A |
IN2/PH | 9 | Low voltage pin max voltage violated. | A |
nHIZ2 | 10 | Low voltage pin max voltage violated. | A |
nSLEEP | 11 | Low voltage pin max voltage violated. | A |
DRVOFF | 12 | Low voltage pin max voltage violated. | A |
nFAULT | 13 | Low voltage pin max voltage violated. | A |
SO | 14 | Low voltage pin max voltage violated. | A |
RSVD | 15 | No impact. Intended operation. | D |
AREF | 16 | Low voltage pin max voltage violated. | A |
AGND | 17 | Device external power supply stuck low. Device gate drivers and shunt amplifier non-operational. | B |
SP | 18 | Current sense invalid. | B |
SN | 19 | Current sense invalid. | B |
GH1 | 20 | HS1 external MOSFET gate stuck high, energy limited by TDRIVE. Device VGS fault. | B |
SH1 | 21 | LS1 external MOSFET non-operational. Device VDS fault. | B |
GL1 | 22 | LS1 external MOSFET gate stuck high, energy limited by TDRIVE. Device VGS fault. May violate GL1 voltage rating. | A |
SL1 | 23 | Device external power supply stuck low. Device gate drivers and shunt amplifier non-operational. | B |
SL2 | 24 | Device external power supply stuck low. Device gate drivers and shunt amplifier non-operational. | B |
GL2 | 25 | LS1 external MOSFET gate stuck high, energy limited by TDRIVE. Device VGS fault. May violate GL1 voltage rating. | A |
SH2 | 26 | LS2 external MOSFET non-operational. Device VDS fault. | B |
GH2 | 27 | HS2 external MOSFET gate stuck high, energy limited by TDRIVE. Device VGS fault. | B |
DRAIN | 28 | High-side VDS monitor sense accuracy impact. | B |
PVDD | 29 | No impact. Intended operation. | D |
VCP | 30 | Device charge pump non-operational. Device CPUV fault. | B |
CPH | 31 | Device charge pump non-operational. Device CPUV fault. | B |
CPL | 32 | Device charge pump non-operational. Device CPUV fault. | A |
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