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This document contains information for TPS37-Q1 and TPS38-Q1 (DSK package) to aid in a functional safety system design. Information provided are:
Figure 1-1 shows the device functional block diagram for reference.
TPS37-Q1 and TPS38-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.
This section provides Functional Safety Failure In Time (FIT) rates for TPS37-Q1 and TPS38-Q1 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total Component FIT Rate | 5 |
Die FIT Rate | 2 |
Package FIT Rate | 3 |
The failure rate and mission profile information in Table 2-1 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS,
BICMOS Digital, analog / mixed | 25 FIT | 55°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.
The failure mode distribution estimation for TPS37-Q1 and TPS38-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
RESET1_XXXX / fails to trip | 8% |
RESET1_XXXX / false trip | 8% |
RESET1_XXXX / trip outside specification (voltage or time) | 31% |
RESET1_XXXX / delay outside specification | 3% |
RESET2_XXOD / fails to trip | 8% |
RESET2_XXOD / false trip | 8% |
RESET2_XXOD / trip outside specification (voltage or time) | 31% |
RESET2_XXOD / delay outside specification | 3% |
This section provides a Failure Mode Analysis (FMA) for the pins of the TPS37-Q1 and TPS38-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality |
B | No device damage, but loss of functionality |
C | No device damage, but performance degradation |
D | No device damage, no impact to functionality or performance |
Figure 4-1 shows the TPS37-Q1 and TPS38-Q1 pin diagram. For a detailed description of the device pins please refer to TPS37-Q1 or TPS38-Q1 in the Pin Configuration and Functions section of the data sheet.
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
PIN NAME | PIN NO. | DESCRIPTION OF POTENTIAL FAILURE EFFECT(S) | FAILURE EFFECT CLASS |
---|---|---|---|
VDD | 1 | VDD short to GND Fault | B |
SENSE1 | 2 | Functionality affected if intent is not to monitor GND | B |
SENSE2 | 3 | Functionality affected if intent is not to monitor GND | B |
RESET1_UVOD | 4 | If open drain option: Unreliable device operation if not shorted to VOH | B |
If push pull option: Not recommended condition | A | ||
RESET2_UVOD | 5 | Unreliable device operation if not shorted to VOH | B |
CTR1 / MR | 6 | Normal operation, RESET1_UVOD will be asserted. | D |
CTS1 | 7 | Normal operation, RESET1_UVOD will be asserted. | D |
CTS2 | 8 | Normal operation, RESET2_UVOD will be asserted. | D |
CTR2 / MR | 9 | Normal operation, RESET2_UVOD will be asserted. | D |
GND | 10 | Normal operation | D |
Central Pad | PAD | Normal operation, Pad is not internally connected | D |
PIN NAME | PIN NO. | DESCRIPTION OF POTENTIAL FAILURE EFFECT(S) | FAILURE EFFECT CLASS |
---|---|---|---|
VDD | 1 | Device Unpowered | B |
SENSE1 | 2 | For fixed voltage threshold option where the applied voltage to
SENSE1 is less than 2.7 V, SENSE1 pin will detect a short to GND. For 800 mV SENSE1 voltage option, the input state will be undetermined. | B |
SENSE2 | 3 | For fixed voltage threshold option where the applied voltage to
SENSE2 is less than 2.7 V, SENSE2 pin will detect a short to GND. For 800 mV SENSE2 voltage option, the input state will be undetermined. | B |
RESET1_UVOD | 4 | Unreliable RESET1_UVOD | B |
RESET2_UVOD | 5 | Unreliable RESET2_UVOD | B |
CTR1 / MR | 6 | Normal operation | D |
CTS1 | 7 | Normal operation | D |
CTS2 | 8 | Normal operation | D |
CTR2 / MR | 9 | Normal operation | D |
GND | 10 | Device Unpowered | B |
Central Pad | PAD | Normal operation, pad is not internally connected | D |
PIN NAME | PIN NO. | SHORTED TO | DESCRIPTION OF POTENTIAL FAILURE EFFECT(S) | FAILURE EFFECT CLASS |
---|---|---|---|---|
VDD | 1 | SENSE1 | Functionality affected if intent is not to monitor VDD | B |
SENSE1 | 2 | SENSE2 | Functionality affected if intent is not to monitor SENSE2 | B |
SENSE2 | 3 | RESET1_UVOD | Functionality affected if intent is not to monitor RESET1_UVOD | B |
RESET1_UVOD | 4 | RESET2_UVOD | If open drain option: Unreliable device operation if not shorted to VOH | B |
RESET1_UVOD | 4 | RESET2_UVOD | If push pull option: Not recommended condition | A |
CTR1 / MR | 6 | CTS1 | Unreliable timing | B |
CTS1 | 7 | CTS2 | Unreliable timing | B |
CTS2 | 8 | CTR2 / MR | Unreliable timing | B |
CTR2 / MR | 9 | GND | Normal operation, a reset event will be asserted. | D |
Central Pad | PAD | N/A | N/A | N/A |
PIN NAME | PIN NO. | DESCRIPTION OF POTENTIAL FAILURE EFFECT(S) | FAILURE EFFECT CLASS |
---|---|---|---|
VDD | 1 | Normal operation | D |
SENSE1 | 2 | Functionality affected if intent is not to monitor VDD | B |
SENSE2 | 3 | Functionality affected if intent is not to monitor VDD | B |
RESET1_UVOD | 4 | Open drain option: Pullup resistor required. Short directly to VDD will affect pullup voltage functionality | B |
Push pull option: Not recommended condition | A | ||
RESET2_UVOD | 5 | Pullup resistor required. Short directly to VDD will affect pullup voltage functionality | B |
CTR1 / MR | 6 | May damage device if VDD is greater than the pin's recommended operating condition | A |
CTS1 | 7 | May damage device if VDD is greater than the pin's recommended operating condition | A |
CTS2 | 8 | May damage device if VDD is greater than the pin's recommended operating condition | A |
CTR2 / MR | 9 | May damage device if VDD is greater than the pin's recommended operating condition | A |
GND | 10 | VDD short to GND Fault | B |
Central Pad | PAD | D |
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