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This document contains information for TS3A27518E-Q1 (TSSOP-24 and QFN-24 package) to aid in a functional safety system design. Information provided are:
Figure 1-1 shows the device functional block diagram for reference.
TS3A27518E-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.
This section provides Functional Safety Failure In Time (FIT) rates for TSSOP-24 package of TS3A27518E-Q1 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total Component FIT Rate | 16 |
Die FIT Rate | 2 |
Package FIT Rate | 14 |
The failure rate and mission profile information in Table 2-1 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS/BICMOS ASICs Analog and Mixed ≦ 50 V supply |
20 FIT | 55°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.
This section provides Functional Safety Failure In Time (FIT) rates for the QFN-24 package of TS3A27518E-Q1 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total Component FIT Rate | 13 |
Die FIT Rate | 2 |
Package FIT Rate | 11 |
The failure rate and mission profile information in Table 2-3 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS/BICMOS ASICs Analog and Mixed ≦ 50 V supply |
20 FIT | 55°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-4 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.
The failure mode distribution estimation for TS3A27518E-Q1 Table 3-1 in comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
MUX channel no output (HIZ) | 20% |
MUX channel stuck NO | 15% |
MUX channel stuck NC | 15% |
MUX functional out of specification voltage or timing | 50% |
The FMD in Table 3-1 excludes short circuit faults across the isolation barrier. Faults for short circuit across the isolation barrier can be excluded according to ISO 61800-5-2:2016 if the following requirements are fulfilled:
Creepage and clearance requirements should be applied according to the specific equipment isolation standards of an application. Care should be taken to maintain the creepage and clearance distance of a board design to ensure that the mounting pads of the isolator on the printed-circuit board do not reduce this distance.
This section provides a Failure Mode Analysis (FMA) for the pins of the TS3A27518E-Q1 (TSSOP-24 and QFN-24 package). The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-9 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality |
B | No device damage, but loss of functionality |
C | No device damage, but performance degradation |
D | No device damage, no impact to functionality or performance |
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
Figure 4-1 shows the TS3A27518E-Q1 pin diagram for the TSSOP-24 package. For a detailed description of the device pins, refer to the Pin Configuration and Functions section in the TS3A27518E-Q1 data sheet.
Pin Name | Pin No. | Description of potential failure effect(s) | Failure effect class |
---|---|---|---|
NC2 | 1 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
NC1 | 2 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
N.C. | 3 | No effect, unconnected pin. | D |
COM1 | 4 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
GND | 5 | No effect; normal operation. | D |
COM2 | 6 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
COM3 | 7 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
VCC | 8 | Device is unpowered and not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be plausible. | A |
COM4 | 9 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
COM5 | 10 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
NO1 | 11 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
COM6 | 12 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
NO2 | 13 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
IN2 | 14 | Address is stuck low. Cannot control the switch states. | B |
NO3 | 15 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
NO6 | 16 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
NO4 | 17 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
NO5 | 18 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
NC5 | 19 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
EN | 20 | EN is stuck low. Can no longer disable the device. | B |
NC4 | 21 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
NC6 | 22 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
NC3 | 23 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
IN1 | 24 | Address is stuck low. Cannot control the switch states. | B |
Pin Name | Pin No. | Description of potential failure effect(s) | Failure effect class |
---|---|---|---|
NC2 | 1 | Corruption of the signal passed onto the COM2 pin. | B |
NC1 | 2 | Corruption of the signal passed onto the COM1 pin. | B |
N.C. | 3 | No effect; unconnected pin. | B |
COM1 | 4 | Corruption of the signal passed onto the NO1/NC1 pins. | B |
GND | 5 | No effect; normal operation. | B |
COM2 | 6 | Corruption of the signal passed onto the NO2/NC2 pins. | B |
COM3 | 7 | Corruption of the signal passed onto the NO3/NC3 pins. | B |
VCC | 8 | Device is unpowered and not functional. | B |
COM4 | 9 | Corruption of the signal passed onto the NO4/NC4 pins. | B |
COM5 | 10 | Corruption of the signal passed onto the NO5/NC5 pins. | B |
NO1 | 11 | Corruption of the signal passed onto the COM1 pin. | B |
COM6 | 12 | Corruption of the signal passed onto the NO6/NC6 pins. | B |
NO2 | 13 | Corruption of the signal passed onto the COM2 pin. | B |
IN2 | 14 | Loss of control of the IN2 pin. Cannot control the switch. Unknown state can cause an increase in the IDD current | B |
NO3 | 15 | Corruption of the signal passed onto the COM3 pin. | B |
NO6 | 16 | Corruption of the signal passed onto the COM6 pin. | B |
NO4 | 17 | Corruption of the signal passed onto the COM4 pin. | B |
NO5 | 18 | Corruption of the signal passed onto the COM5 pin. | B |
NC5 | 19 | Corruption of the signal passed onto the COM5 pin. | B |
EN | 20 | Loss of control of the EN pin. Cannot disable the switch. Unknown state can cause an increase in the IDD current | B |
NC4 | 21 | Corruption of the signal passed onto the COM4 pin. | B |
NC6 | 22 | Corruption of the signal passed onto the COM6 pin. | B |
NC3 | 23 | Corruption of the signal passed onto the COM3 pin. | B |
IN1 | 24 | Loss of control of the IN2 pin. Cannot control the switch. Unknown state can cause an increase in the IDD current. | B |
Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|---|
NC2 | 1 | NC1 | Possible corruption of the signal passed onto the COM pin. | B |
NC1 | 2 | N.C. | Unconnected pin, electrically floating; no effect. | D |
N.C. | 3 | COM1 | Unconnected pin, electrically floating; no effect. | D |
COM1 | 4 | GND | Corruption of the signal passed onto the NO1/NC1 pins. If there is no limiting resistor in the switch path, then device damage is possible. | A |
GND | 5 | COM2 | Device functions, but the analog signal is corrupted. If there is no limiting resistor in the switch path, then device damage is possible. | A |
COM2 | 6 | COM3 | Possible corruption of the signal passed onto the NO/NC pins. | B |
COM3 | 7 | VCC | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
VCC | 8 | COM4 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
COM4 | 9 | COM5 | Possible corruption of the signal passed onto the NO/NC pins. | B |
COM5 | 10 | NO1 | Possible corruption of the signal passed onto the COM5 and NO1/NO5 pin. | B |
NO1 | 11 | COM6 | Possible corruption of the signal passed onto the NO1 and COM6/COM1 pin. | B |
COM6 | 12 | NO2 | Not considered; corner pin. | D |
NO2 | 13 | IN2 | Possible corruption of the signal passed onto the COMx pins. Loss of control of the switch state. | B |
IN2 | 14 | NO3 | Possible corruption of the signal passed onto the COMx pins. Loss of control of the switch state. | B |
NO3 | 15 | NO6 | Possible corruption of the signal passed onto the COM pin. | B |
NO6 | 16 | NO4 | Possible corruption of the signal passed onto the COM pin. | B |
NO4 | 17 | NO5 | Possible corruption of the signal passed onto the COM pin. | B |
NO5 | 18 | NC5 | Possible corruption of the signal passed onto the COM pin. | B |
NC5 | 19 | EN | Corruption of the signal passed onto the NC5 pin. Loss of control of the switch state. | A |
EN | 20 | NC4 | Corruption of the signal passed onto the NC4 pin. Loss of control of the switch state. | A |
NC4 | 21 | NC6 | Possible corruption of the signal passed onto the COM pin. | B |
NC6 | 22 | NC3 | Possible corruption of the signal passed onto the COM pin. | B |
NC3 | 23 | IN1 | Possible corruption of the signal passed onto the COMx pins. Loss of control of the switch state. | B |
IN1 | 24 | NC2 | Not considered; corner pin. | D |
Pin Name | Pin No. | Description of potential failure effect(s) | Failure effect class |
---|---|---|---|
NC2 | 1 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
NC1 | 2 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
N.C. | 3 | No effect, unconnected pin. | D |
COM1 | 4 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
GND | 5 | Device is unpowered and not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be plausible. | A |
COM2 | 6 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
COM3 | 7 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
VCC | 8 | No effect; normal operation. | D |
COM4 | 9 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
COM5 | 10 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
NO1 | 11 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
COM6 | 12 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
NO2 | 13 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
IN2 | 14 | Address stuck high. Cannot control the switch states. | B |
NO3 | 15 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
NO6 | 16 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
NO4 | 17 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
NO5 | 18 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
NC5 | 19 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
/EN | 20 | EN stuck high. Can no longer enable the device. | B |
NC4 | 21 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
NC6 | 22 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
NC3 | 23 | Corruption of the analog signal. If there is no limiting resistor in the switch path, then device damage is possible. | A |
IN1 | 24 | Address stuck high. Cannot control the switch states. | B |