ZHCSDX9E September 2014 – January 2017 AMC1304L05 , AMC1304L25 , AMC1304M05 , AMC1304M25
PRODUCTION DATA.
AMC1304 是一款高精度 Δ-Σ (ΔΣ) 调制器,通过磁场抗扰度较高的电容式双隔离栅隔离输出与输入电路。根据 DIN V VDE V 0884-10、UL1577 和 CSA 标准,该隔离栅经认证可提供高达 7000 VPEAK 的增强型隔离。当与隔离电源配合使用时,该器件可防止共模高电压线路上的噪声电流进入本地系统接地,从而干扰或损害低电压电路。
AMC1304 的输入针对直接连接分流电阻或其他低电压等级信号源进行了优化。凭借独特的 ±50mV 低输入电压范围,器件可通过分流显著降低功耗,同时具有出色的交流和直流性能。通过使用适当的数字滤波器(即集成于 TMS320F2807x 或 TMS320F2837x 系列)来抽取位流,该器件可在 78kSPS 数据速率下实现 81dB (13.2 ENOB) 动态范围的 16 位分辨率。
在高侧,调制器由集成的低压降 (LDO) 稳压器供电,该稳压器支持介于 4V 和 18V 之间的未经稳压的输入电压 (LDOIN)。隔离数字接口由 3.3V 或 5V 电源 (DVDD) 供电。
AMC1304 采用宽体小外形尺寸集成电路 (SOIC)-16 (DW) 封装,工作温度范围为 –40°C 至 +125°C。
器件型号 | 封装 | 封装尺寸(标称值) |
---|---|---|
AMC1304x | SOIC (16) | 10.30mm x 7.50mm |
Changes from D Revision (August 2016) to E Revision
Changes from C Revision (September 2015) to D Revision
Changes from B Revision (July 2015) to C Revision
Changes from A Revision (May 2015) to B Revision
Changes from * Revision (September 2014) to A Revision
PIN | I/O | DESCRIPTION | ||
---|---|---|---|---|
NAME | NO. | |||
AMC1304Lx (LVDS) |
AMC1304Mx (CMOS) |
|||
AGND | 4 | 4 | — | This pin is internally connected to pin 8 and can be left unconnected or tied to high-side ground |
8 | 8 | — | High-side ground reference | |
AINN | 3 | 3 | I | Inverting analog input |
AINP | 2 | 2 | I | Noninverting analog input |
CLKIN | 13 | 13 | I | Modulator clock input, 5 MHz to 20.1 MHz |
CLKIN_N | 12 | — | I | Inverted modulator clock input |
DGND | 9, 16 | 9, 16 | — | Controller-side ground reference |
DOUT | 11 | 11 | O | Modulator data output |
DOUT_N | 10 | — | O | Inverted modulator data output |
DVDD | 14 | 14 | — | Controller-side power supply, 3.0 V to 5.5 V. See the Power-Supply Recommendations section for decoupling recommendations. |
LDOIN | 6 | 6 | — | Low dropout regulator input, 4 V to 18 V |
NC | 1 | 1 | — | This pin can be connected to VCAP or left unconnected |
5 | 5 | — | This pin can be left unconnected or tied to AGND only | |
— | 10, 12 | — | These pins have no internal connection | |
15 | 15 | — | This pin can be left unconnected or tied to DVDD only | |
VCAP | 7 | 7 | — | LDO output. See the Power-Supply Recommendations section for decoupling recommendations. |
VALUE | UNIT | |||
---|---|---|---|---|
V(ESD) | Electrostatic discharge | Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) | ±2500 | V |
Charged-device model (CDM), per JEDEC specification JESD22-C101(2) | ±1000 |
MIN | NOM | MAX | UNIT | ||
---|---|---|---|---|---|
LDOIN | LDO input supply voltage (LDOIN pin) | 4.0 | 15.0 | 18.0 | V |
DVDD | Digital (controller-side) supply voltage (DVDD pin) | 3.0 | 3.3 | 5.5 | V |
TA | Operating ambient temperature range | –40 | 125 | °C |
THERMAL METRIC (1) | AMC1304x | UNIT | |
---|---|---|---|
DW (SOIC) | |||
16 PINS | |||
RθJA | Junction-to-ambient thermal resistance | 80.2 | °C/W |
RθJC(top) | Junction-to-case (top) thermal resistance | 40.5 | °C/W |
RθJB | Junction-to-board thermal resistance | 45.1 | °C/W |
ψJT | Junction-to-top characterization parameter | 11.9 | °C/W |
ψJB | Junction-to-board characterization parameter | 44.5 | °C/W |
RθJC(bot) | Junction-to-case (bottom) thermal resistance | n/a | °C/W |
PARAMETER | TEST CONDITIONS | VALUE | UNIT | |
---|---|---|---|---|
GENERAL | ||||
CLR | Minimum air gap (clearance)(1) | Shortest pin-to-pin distance through air | ≥ 8 | mm |
CPG | Minimum external tracking (creepage)(1) | Shortest pin-to-pin distance across the package surface | ≥ 8 | mm |
DTI | Distance through insulation | Minimum internal gap (internal clearance) of the double insulation (2 × 0.0135 mm) | 0.027 | mm |
CTI | Comparative tracking index | DIN EN 60112 (VDE 0303-11); IEC 60112 | ≥ 600 | V |
Material group | According to IEC 60664-1 | I | ||
Overvoltage category per IEC 60664-1 | Rated mains voltage ≤ 300 VRMS | I-IV | ||
Rated mains voltage ≤ 600 VRMS | I-III | |||
Rated mains voltage ≤ 1000 VRMS | I-II | |||
DIN V VDE V 0884-10 (VDE V 0884-10): 2006-12(2) | ||||
VIORM | Maximum repetitive peak isolation voltage | At ac voltage (bipolar or unipolar) | 1414 | VPK |
VIOWM | Maximum-rated isolation working voltage | At ac voltage (sine wave) | 1000 | VRMS |
At dc voltage | 1500 | VDC | ||
VIOTM | Maximum transient isolation voltage | VTEST = VIOTM, t = 60 s (qualification test) | 7000 | VPK |
VTEST = 1.2 x VIOTM, t = 1 s (100% production test) | 8400 | |||
VIOSM | Maximum surge isolation voltage(3) | Test method per IEC 60065, 1.2/50-μs waveform, VTEST = 1.6 x VIOSM = 10000 VPK (qualification) | 6250 | VPK |
qpd | Apparent charge(4) | Method a, after input/output safety test subgroup 2 / 3, Vini = VIOTM, tini = 60 s, Vpd(m) = 1.2 x VIORM = 1697 VPK, tm = 10 s | ≤ 5 | pC |
Method a, after environmental tests subgroup 1, Vini = VIOTM, tini = 60 s, Vpd(m) = 1.6 x VIORM = 2263 VPK, tm = 10 s | ≤ 5 | pC | ||
Method b1, at routine test (100% production) and preconditioning (type test), Vini = VIOTM, tini = 1 s, Vpd(m) = 1.875 x VIORM = 2652 VPK, tm = 1 s | ≤ 5 | pC | ||
CIO | Barrier capacitance, input to output(5) | VIO = 0.5 VPP at 1 MHz | 1.2 | pF |
RIO | Insulation resistance, input to output(5) | VIO = 500 V at TS = 150°C | > 109 | Ω |
Pollution degree | 2 | |||
Climatic category | 40/125/21 | |||
UL1577 | ||||
VISO | Withstand isolation voltage | VTEST = VISO = 5000 VRMS or 7000 VDC, t = 60 s (qualification test), VTEST = 1.2 x VISO = 6000 VRMS, t = 1 s (100% production test) | 5000 | VRMS |
VDE | UL | ||
---|---|---|---|
Certified according to DIN V VDE V 0884-10 (VDE V 0884-10): 2006-12, DIN EN 60950-1 (VDE 0805 Teil 1): 2014-08, and DIN EN 60095 (VDE 0860): 2005-11 | Recognized under UL1577 component recognition and CSA component acceptance NO 5 programs | ||
Reinforced insulation | Single protection | ||
File number: 40040142 | File number: E181974 |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
IS | Safety input, output, or supply current | θJA = 80.2°C/W, LDOIN = 18 V, TJ = 150°C, TA = 25°C, see Figure 3 |
86.5 | mA | ||
PS | Safety input, output, or total power | θJA = 80.2°C/W, TJ = 150°C, TA = 25°C, see Figure 4 | 1558(1) | mW | ||
TS | Maximum safety temperature | 150 | °C |
The maximum safety temperature is the maximum junction temperature specified for the device. The power dissipation and junction-to-air thermal impedance of the device installed in the application hardware determines the junction temperature. The assumed junction-to-air thermal resistance in the Thermal Information table is that of a device installed on a high-K test board for leaded surface-mount packages. The power is the recommended maximum input voltage times the current. The junction temperature is then the ambient temperature plus the power times the junction-to-air thermal resistance.
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
ANALOG INPUTS | ||||||
VClipping | Maximum differential voltage input range (AINP-AINN) |
±62.5 | mV | |||
FSR | Specified linear full-scale range (AINP-AINN) |
–50 | 50 | mV | ||
VCM | Operating common-mode input range | –0.032 | 1.2 | V | ||
CID | Differential input capacitance | 2 | pF | |||
IIB | Input bias current | Inputs shorted to AGND | –97 | –72 | –57 | μA |
RID | Differential input resistance | 5 | kΩ | |||
IIO | Input offset current | ±5 | nA | |||
CMTI | Common-mode transient immunity | 15 | kV/μs | |||
CMRR | Common-mode rejection ratio | fIN = 0 Hz, VCM min ≤ VIN ≤ VCM max |
–98 | dB | ||
fIN from 0.1 Hz to 50 kHz, VCM min ≤ VIN ≤ VCM max |
–85 | |||||
BW | Input bandwidth | 800 | kHz | |||
DC ACCURACY | ||||||
DNL | Differential nonlinearity | Resolution: 16 bits | –0.99 | 0.99 | LSB | |
INL | Integral nonlinearity (1) | Resolution: 16 bits | –4 | ±1.5 | 4 | LSB |
EO | Offset error | Initial, at 25°C | –50 | ±2.5 | 50 | µV |
TCEO | Offset error thermal drift (2) | –1.3 | 1.3 | μV/°C | ||
EG | Gain error | Initial, at 25°C | –0.3% | –0.02% | 0.3% | |
TCEG | Gain error thermal drift (3) | –40 | ±20 | 40 | ppm/°C | |
PSRR | Power-supply rejection ratio | LDOIN from 4 V to 18 V, at dc | –110 | dB | ||
LDOIN from 4 V to 18 V, from 0.1 Hz to 50 kHz | –110 | |||||
AC ACCURACY | ||||||
SNR | Signal-to-noise ratio | fIN = 1 kHz | 76 | 81.5 | dB | |
SINAD | Signal-to-noise + distortion | fIN = 1 kHz | 76 | 81 | dB | |
THD | Total harmonic distortion | fIN = 1 kHz | –90 | –81 | dB | |
SFDR | Spurious-free dynamic range | fIN = 1 kHz | 81 | 90 | dB | |
DIGITAL INPUTS/OUTPUTS | ||||||
External Clock | ||||||
fCLKIN | Input clock frequency | 5 | 20 | 20.1 | MHz | |
DutyCLKIN | Duty cycle | 5 MHz ≤ fCLKIN ≤ 20.1 MHz | 40% | 50% | 60% | |
CMOS Logic Family (AMC1304M05, CMOS with Schmitt Trigger) | ||||||
IIN | Input current | DGND ≤ VIN ≤ DVDD | –1 | 1 | μA | |
CIN | Input capacitance | 5 | pF | |||
VIH | High-level input voltage | 0.7 × DVDD | DVDD + 0.3 | V | ||
VIL | Low-level input voltage | –0.3 | 0.3 × DVDD | V | ||
CLOAD | Output load capacitance | fCLKIN = 20 MHz | 30 | pF | ||
VOH | High-level output voltage | IOH = –20 µA | DVDD – 0.1 | V | ||
IOH = –4 mA | DVDD – 0.4 | |||||
VOL | Low-level output voltage | IOL = 20 µA | 0.1 | V | ||
IOL = 4 mA | 0.4 | |||||
LVDS Logic Family (AMC1304L05)(4) | ||||||
VT | Differential output voltage | RLOAD = 100 Ω | 250 | 350 | 450 | mV |
VOC | Common-mode output voltage | 1.125 | 1.23 | 1.375 | V | |
VID | Differential input voltage | 100 | 350 | 600 | mV | |
VIC | Common-mode input voltage | VID = 100 mV | 0.05 | 1.25 | 3.25 | V |
II | Receiver input current | DGND ≤ VIN ≤ 3.3 V | –24 | 0 | 20 | µA |
POWER SUPPLY | ||||||
LDOIN | LDOIN pin input voltage | 4.0 | 15.0 | 18.0 | V | |
VCAP | VCAP pin voltage | 3.45 | V | |||
ILDOIN | LDOIN pin input current | 5.3 | 6.5 | mA | ||
DVDD | Controller-side supply voltage | 3.0 | 3.3 | 5.5 | V | |
IDVDD | Controller-side supply current | LVDS, RLOAD = 100 Ω | 6.1 | 8 | mA | |
CMOS, 3.0 V ≤ DVDD ≤ 3.6 V, CLOAD = 5 pF |
2.7 | 4.0 | ||||
CMOS, 4.5 V ≤ DVDD ≤ 5.5 V, CLOAD = 5 pF |
3.2 | 5.5 |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
ANALOG INPUTS | ||||||
VClipping | Maximum differential voltage input range (AINP-AINN) |
±312.5 | mV | |||
FSR | Specified linear full-scale range (AINP-AINN) |
–250 | 250 | mV | ||
VCM | Operating common-mode input range | –0.16 | 1.2 | V | ||
CID | Differential input capacitance | 1 | pF | |||
IIB | Input bias current | Inputs shorted to AGND | –82 | –60 | –48 | μA |
RID | Differential input resistance | 25 | kΩ | |||
IIO | Input offset current | ±5 | nA | |||
CMTI | Common-mode transient immunity | 15 | kV/μs | |||
CMRR | Common-mode rejection ratio | fIN = 0 Hz, VCM min ≤ VIN ≤ VCM max |
–98 | dB | ||
fIN from 0.1 Hz to 50 kHz, VCM min ≤ VIN ≤ VCM max |
–98 | |||||
BW | Input bandwidth | 1000 | kHz | |||
DC ACCURACY | ||||||
DNL | Differential nonlinearity | Resolution: 16 bits | –0.99 | 0.99 | LSB | |
INL | Integral nonlinearity(1) | Resolution: 16 bits | –4 | ±1.5 | 4 | LSB |
EO | Offset error | Initial, at 25°C | –100 | ±25 | 100 | µV |
TCEO | Offset error thermal drift(2) | –1.3 | 1.3 | μV/°C | ||
EG | Gain error | Initial, at 25°C | –0.2% | –0.05% | 0.2% | |
TCEG | Gain error thermal drift(3) | –40 | ±20 | 40 | ppm/°C | |
PSRR | Power-supply rejection ratio | LDOIN from 4 V to 18 V, at dc | –110 | dB | ||
LDOIN from 4 V to 18 V, from 0.1 Hz to 50 kHz |
–110 | |||||
AC ACCURACY | ||||||
SNR | Signal-to-noise ratio | fIN = 1 kHz | 82 | 85 | dB | |
SINAD | Signal-to-noise + distortion | fIN = 1 kHz | 80 | 84 | dB | |
THD | Total harmonic distortion | fIN = 1 kHz | –90 | –81 | dB | |
SFDR | Spurious-free dynamic range | fIN = 1 kHz | 81 | 90 | dB | |
DIGITAL INPUTS/OUTPUTS | ||||||
External Clock | ||||||
fCLKIN | Input clock frequency | 5 | 20 | 20.1 | MHz | |
DutyCLKIN | Duty cycle | 5 MHz ≤ fCLKIN ≤ 20.1 MHz | 40% | 50% | 60% | |
CMOS Logic Family (AMC1304M25, CMOS with Schmitt Trigger) | ||||||
IIN | Input current | DGND ≤ VIN ≤ DVDD | –1 | 1 | μA | |
CIN | Input capacitance | 5 | pF | |||
VIH | High-level input voltage | 0.7 × DVDD | DVDD + 0.3 | V | ||
VIL | Low-level input voltage | –0.3 | 0.3 × DVDD | V | ||
CLOAD | Output load capacitance | fCLKIN = 20 MHz | 30 | pF | ||
VOH | High-level output voltage | IOH = –20 µA | DVDD – 0.1 | V | ||
IOH = –4 mA | DVDD – 0.4 | V | ||||
VOL | Low-level output voltage | IOL = 20 µA | 0.1 | V | ||
IOL = 4 mA | 0.4 | V | ||||
LVDS Logic Family (AMC1304L25)(4) | ||||||
VT | Differential output voltage | RLOAD = 100 Ω | 250 | 350 | 450 | mV |
VOC | Common-mode output voltage | 1.125 | 1.23 | 1.375 | V | |
VID | Differential input voltage | 100 | 350 | 600 | mV | |
VIC | Common-mode input voltage | VID = 100 mV | 0.05 | 1.25 | 3.25 | V |
II | Receiver input current | DGND ≤ VIN ≤ 3.3 V | –24 | 0 | 20 | µA |
POWER SUPPLY | ||||||
LDOIN | LDOIN pin input voltage | 4.0 | 15.0 | 18.0 | V | |
VCAP | VCAP pin voltage | 3.45 | V | |||
ILDOIN | LDOIN pin input current | 5.3 | 6.5 | mA | ||
DVDD | Controller-side supply voltage | 3.0 | 3.3 | 5.5 | V | |
IDVDD | Controller-side supply current | LVDS, RLOAD = 100 Ω | 6.1 | 8.0 | mA | |
CMOS, 3.0 V ≤ DVDD ≤ 3.6 V, CLOAD = 5 pF |
2.7 | 4.0 | ||||
CMOS, 4.5 V ≤ DVDD ≤ 5.5 V, CLOAD = 5 pF |
3.2 | 5.5 |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
tCLK | CLKIN, CLKIN_N clock period | 49.75 | 50 | 200 | ns | |
tHIGH | CLKIN, CLKIN_N clock high time | 19.9 | 25 | 120 | ns | |
tLOW | CLKIN, CLKIN_N clock low time | 19.9 | 25 | 120 | ns | |
tD | Falling edge of CLKIN, CLKIN_N to DOUT, DOUT_N valid delay | 0 | 15 | ns | ||
tISTART | Interface startup time | DVDD at 3.0 V (min) to DOUT, DOUT_N valid with LDO_IN > 4 V | 32 | 32 | CLKIN cycles | |
tASTART | Analog startup time | LDOIN step to 4 V with DVDD ≥ 3.0 V, and 0.1 µF at VCAP pin | 1 | ms |
AMC1304x05, 4096-point FFT, VIN = 100 mVPP |
AMC1304x25, 4096-point FFT, VIN = 500 mVPP |
AMC1304x05 |
The differential analog input (AINP and AINN) of the AMC1304 is a fully-differential amplifier feeding the switched-capacitor input of a second-order, delta-sigma (ΔΣ) modulator stage that digitizes the input signal into a 1-bit output stream. The isolated data output (DOUT and DOUT_N) of the converter provides a stream of digital ones and zeros that is synchronous to the externally-provided clock source at the CLKIN pin with a frequency in the range of 5 MHz to 20.1 MHz. The time average of this serial bit-stream output is proportional to the analog input voltage.
The Functional Block Diagram section shows a detailed block diagram of the AMC1304. The analog input range is tailored to directly accommodate a voltage drop across a shunt resistor used for current sensing. The SiO2-based capacitive isolation barrier supports a high level of magnetic field immunity as described in the ISO72x Digital Isolator Magnetic-Field Immunity application report (SLLA181A), available for download at www.ti.com. The external clock input simplifies the synchronization of multiple current-sensing channels on the system level. The extended frequency range of up to 20 MHz supports higher performance levels compared to the other solutions available on the market.
The AMC1304 incorporates a front-end circuitry that contains a differential amplifier and sampling stage, followed by a ΔΣ modulator. The gain of the differential amplifier is set by internal precision resistors to a factor of 4 for devices with a specified input voltage range of ±250 mV (this value is for the AMC1304x25), or to a factor of 20 in devices with a ±50-mV input voltage range (for the AMC1304x05), resulting in a differential input impedance of 5 kΩ (for the AMC1304x05) or 25 kΩ (for the AMC1304x25).
Consider the input impedance of the AMC1304 in designs with high-impedance signal sources that can cause degradation of gain and offset specifications. The importance of this effect, however, depends on the desired system performance. Additionally, the input bias current caused by the internal common-mode voltage at the output of the differential amplifier causes an offset that is dependent on the actual amplitude of the input signal. See the Isolated Voltage Sensing section for more details on reducing these effects.
There are two restrictions on the analog input signals (AINP and AINN). First, if the input voltage exceeds the range AGND – 6 V to 3.7 V, the input current must be limited to 10 mA because the device input electrostatic discharge (ESD) diodes turn on. In addition, the linearity and noise performance of the device are ensured only when the differential analog input voltage remains within the specified linear full-scale range (FSR), that is ±250 mV (for the AMC1304x25) or ±50 mV (for the AMC1304x05), and within the specified input common-mode range.
The modulator implemented in the AMC1304 is a second-order, switched-capacitor, feed-forward ΔΣ modulator, such as the one conceptualized in Figure 48. The analog input voltage VIN and the output V5 of the 1-bit digital-to-analog converter (DAC) are differentiated, providing an analog voltage V1 at the input of the first integrator stage. The output of the first integrator feeds the input of the second integrator stage, resulting in output voltage V3 that is differentiated with the input signal VIN and the output of the first integrator V2. Depending on the polarity of the resulting voltage V4, the output of the comparator is changed. In this case, the 1-bit DAC responds on the next clock pulse by changing its analog output voltage V5, causing the integrators to progress in the opposite direction and forcing the value of the integrator output to track the average value of the input.
The modulator shifts the quantization noise to high frequencies, as shown in Figure 49. Therefore, use a low-pass digital filter at the output of the device to increase the overall performance. This filter is also used to convert from the 1-bit data stream at a high sampling rate into a higher-bit data word at a lower rate (decimation). TI's microcontroller families TMS320F2807x and TMS320F2837x offer a suitable programmable, hardwired filter structure termed a sigma-delta filter module (SDFM) optimized for usage with the AMC1304 family. Also, SD24_B converters on the MSP430F677x microcontrollers offer a path to directly access the integrated sinc-filters, thus offering a system-level solution for multichannel, isolated current sensing. An additional option is to use a suitable application-specific device, such as the AMC1210 (a four-channel digital sinc-filter). Alternatively, a field-programmable gate array (FPGA) can be used to implement the digital filter.
A differential input signal of 0 V ideally produces a stream of ones and zeros that are high 50% of the time. A differential input of 250 mV (for the AMC1304x25) or 50 mV (for the AMC1304x05) produces a stream of ones and zeros that are high 90% of the time. A differential input of –250 mV (–50 mV for the AMC1304x05) produces a stream of ones and zeros that are high 10% of the time. These input voltages are also the specified linear ranges of the different AMC1304 versions with performance as specified in this data sheet. If the input voltage value exceeds these ranges, the output of the modulator shows non-linear behavior when the quantization noise increases. The output of the modulator clips with a stream of only zeros with an input less than or equal to –312.5 mV (–62.5 mV for the AMC1304x05) or with a stream of only ones with an input greater than or equal to 312.5 mV (62.5 mV for the AMC1304x05). In this case, however, the AMC1304 generates a single 1 (if the input is at negative full-scale) or 0 every 128 clock cycles to indicate proper device function (see the Fail-Safe Output section for more details). The input voltage versus the output modulator signal is shown in Figure 50.
The density of ones in the output bit-stream for any input voltage value (with the exception of a full-scale input signal, as described in the Output Behavior in Case of a Full-Scale Input section) can be calculated using Equation 1:
The AMC1304 system clock is typically 20 MHz and is provided externally at the CLKIN pin. Data are synchronously provided at 20 MHz at the DOUT pin. Data change at the CLKIN falling edge. For more details, see the Switching Characteristics table.
In the case of a missing high-side supply voltage (LDOIN), the output of a ΔΣ modulator is not defined and can cause a system malfunction. In systems with high safety requirements, this behavior is not acceptable. Therefore, the AMC1304 implements a fail-safe output function that ensures the device maintains its output level in case of a missing LDOIN, as shown in Figure 51.
If a full-scale input signal is applied to the AMC1304 (that is, VIN ≥ VClipping), the device generates a single one or zero every 128 bits at DOUT, depending on the actual polarity of the signal being sensed, as shown in Figure 52. In this way, differentiating between a missing LDOIN and a full-scale input signal is possible on the system level.