The DAC38RF82 and DAC38RF89 are high performance, wide bandwidth RF-sampling digital-to-analog (DACs) that are capable of dual channel input data rate up to 3.33 GSPS or single-channel operation with 8-bits up to 9-GSPS. The devices have a low power JESD204B Interface with up to 8 lanes, with a maximum bit rate of 12.5 Gbps (DAC38RF89) and 12.8 Gbps (DAC38RF82).
In dual channel operation, the input interface is capable of data rates up to 3.33 GSPS at 12-bits and 2.5 GSPS at 16-bits resolution without interpolation. When used as a complex baseband transmitter with interpolation modes from 2x to 24x, the DAC38RF82 or DAC38RF89 is capable of synthesizing wideband signals up to 2 GHz bandwidth with 16-bit input resolution and 2.66 GHz bandwidth with 12-bit input resolution.
The 8-bit mode allows an input at the full 9 GSPS maximum DAC sample rate and can synthesize wideband signals from 0 to 4.5 GHz.
An optional low jitter PLL/VCO simplifies the DAC clock generation by allowing use of a lower frequency reference clock. DAC38RF82 and DAC38RF89 support different VCO frequency ranges, summarized in Device Comparison Table.
PART NUMBER | PACKAGE | BODY SIZE (NOM) |
---|---|---|
DAC38RF82 | FCBGA (144) | 10.0 mm x 10.0 mm |
DAC38RF89 |
Changes from C Revision (August 2017) to D Revision
Changes from B Revision (August 2017) to C Revision
Changes from A Revision (April 2017) to B Revision
Changes from * Revision (February 2017) to A Revision
PART NUMBER | ANALOG OUTPUT TYPE | VCO0 CENTER FREQUENCY | VCO1 CENTER FREQUENCY |
---|---|---|---|
DAC38RF82 | Differential | 5.9 GHz | 8.9 GHz |
DAC38RF89 | Differential | 5 GHz | 7.5 GHz |
PIN | I/O | DESCRIPTION | |
---|---|---|---|
NO. | NAME | ||
C11, C12, D11, E11, F12, J12, K11, L11, M11, M12 | AGND | – | Analog ground. |
K8 | ALARM | O | CMOS output for ALARM condition. Default polarity is active low, but can be changed to active high via RESET_CONFIG alm_out_pol control bit.. |
G3 | AMUX0 | O | Analog test pin for SerDes, Lane 0 to Lane 3. Can be left floating. |
F3 | AMUX1 | O | Analog test pin for SerDes, Lane 4 to Lane 7. Can be left floating. |
C8 | ATEST | O | Analog test pin for DAC, references and PLL. Can be left floating. |
A7 | CLKTX+ | O | Divided output clock, internal 100 Ω differential termination, self-biased, positive terminal. |
A6 | CLKTX- | O | Divided output clock, internal 100 Ω differential termination, self-biased, negative terminal. |
A10 | DACCLK+ | I | Device clock, internal 100 Ω differential termination, self-biased, positive terminal. |
A9 | DACCLK- | I | Device clock, internal 100 Ω differential termination, self-biased, negative terminal. |
A12 | DACCLKSE | I | Single ended device clock optional input. Can be left floating if not used, internal 50 Ω termination. |
A2, B2, C2, D2, D6, E2, E7, F2, F6, G2, G7, H6, J7, K2, L2, L3, L4, L5, M6 | DGND | - | Digital ground. |
C10 | EXTIO | I/O | Requires a 0.1 μF decoupling capacitor to AGND. |
K7 | GPI0 | - | Factory use only. User should GND. |
M7 | GPI1 | - | Factory use only. User should GND. |
L7 | GPO0 | O | Used for CMOS SYNC0\ signal. |
L6 | GPO1 | O | Used for CMOS SYNC1\ signal. |
D3 | IFORCE | O | Test pin for on chip parametrics. Can be left floating. |
C9 | RBIAS | O | Full-scale output current bias. Change the full-scale output current through DACFS in register DACFS (8.5.72). Expected to be 3.6 kΩ to GND for 40 mA full scale output. |
K9 | RESET | I | Active low input for chip RESET, which resets all the programming registers to their default state. Internal pull-up. |
J1 | RX0+ | I | CML SerDes interface lane 0 input, positive |
K1 | RX0- | I | CML SerDes interface lane 0 input, negative |
M1 | RX1+ | I | CML SerDes interface lane 1 input, positive |
L1 | RX1- | I | CML SerDes interface lane 1 input, negative |
M2 | RX2+ | I | CML SerDes interface lane 2 input, positive |
M3 | RX2- | I | CML SerDes interface lane 2 input, negative |
M5 | RX3+ | I | CML SerDes interface lane 3 input, positive |
M4 | RX3- | I | CML SerDes interface lane 3 input, negative |
H1 | RX4+ | I | CML SerDes interface lane 4 input, positive |
G1 | RX4- | I | CML SerDes interface lane 4 input, negative |
E1 | RX5+ | I | CML SerDes interface lane 5 input, positive |
F1 | RX5- | I | CML SerDes interface lane 5 input, negative |
D1 | RX6+ | I | CML SerDes interface lane 6 input, positive |
C1 | RX6- | I | CML SerDes interface lane 6 input, negative |
A1 | RX7+ | I | CML SerDes interface lane 7 input, positive |
B1 | RX7- | I | CML SerDes interface lane 7 input, negative |
L9 | SCLK | I | Serial interface clock. Internal pull-down. |
M8 | SDEN | I | Active low serial data enable, always an input to the DAC38RFxx. Internal pull-up. |
M10 | SDIO | I/O | Serial interface data. Bi-directional in 3-pin mode (default) and uni-directional input 4-pin mode. Internal pull-down. |
M9 | SDO | O | Uni-directional serial interface data output in 4-pin mode. The SDO pin is tri-stated in 3-pin interface mode (default). |
L8 | SLEEP | I | Active high asynchronous hardware power-down input. Internal pull-down. |
C4 | SYNC0+ | O | Synchronization request to transmitter for JESD204B link 0, LVDS positive output. |
C3 | SYNC0- | O | Synchronization request to transmitter for JESD204B link 0, LVDS negative output. |
C7 | SYNC1+ | O | Synchronization request to transmitter for JESD204B link 1, LVDS positive output. |
C6 | SYNC1- | O | Synchronization request to transmitter for JESD204B link 1, LVDS negative output. |
A3 | SYSREF+ | I | LVPECL SYSREF positive input, internal 100 Ω differential termination, self biased. This positive/negative pair is captured with the rising edge of DACCLKP/N. It is used for multiple DAC synchronization. |
A4 | SYSREF- | I | LVPECL SYSREF negative input, self biased, internal 100 Ω differential termination. (See the SYSREF+ description) |
K4 | TCLK | I | JTAG test clock. Internal pull-down |
H4 | TDI | I | JTAG test data in. Internal pull-up |
J4 | TDO | O | JTAG test data out. Internal pull-up |
K3 | TESTMODE | - | This pin is used for factory testing.
Recommended to connect to ground for normal operation. |
K5 | TMS | I | JTAG test mode select. Internal pull-up |
J5 | TRST | I | JTAG test reset. Internal pull-up. Must be connected to ground if not used |
K6 | TXENABLE | I | Transmit enable active high input. Internal pull-down.
This pin is ORed with spi_txenable bit in JESD_FIFO register to enable analog output data transmission. To enable analog output data transmission, pull CMOS TXENABLE pin to high. To disable analog output, pull CMOS TXENABLE pin to low. The DAC output is forced to midscale. |
F11, J11 | VDDA1 | I | Analog 1 V supply voltage. Must be separated from VDDDIG1 supply for best performance. |
G11, H11 | VDDA18 | I | Analog 1.8 V supply voltage. (1.8 V) |
D8, E8 | VDDPLL1 | I | Analog 1 V supply for PLL. |
B9, B10 | VDDAPLL18 | I | PLL analog supply voltage. (1.8 V) |
D9, E9 | VDDAVCO18 | I | Analog supply voltage for VCO (1.8 V) |
G9, H9 | VDDCLK1 | I | Internal clock buffer supply voltage (1 V).
It is recommended to isolate this supply from VDDDIG1 and VDDA1. |
G8, H8 | VDDL1_1 | I | DAC core supply voltage. (1 V) |
G10, H10 | VDDL2_1 | I | DAC core supply voltage. (1 V) |
A5, B5, C5, D5, D7, E3, E4, E5, E6, F4, F5, G4, G5 | VDDDIG1 | I | Digital supply voltage. (1 V).
It is recommended to isolate this supply from VDDCLK1 and VDDA1. |
F7, H7, G6, J6 | VDDE1 | I | Digital Encoder supply voltage (1 V).
Must be separated from VDDDIG1 supply |
H5 | VDDIO18 | I | Supply voltage for all digital I/O and CMOS I/O. (1.8 V) |
G12, H12 | VDDOUT18 | I | DAC output supply. (1.8 V) |
H2, J2 | VDDR18 | I | Supply voltage for SerDes. (1.8 V) |
B3, B4 | VDDS18 | I | Supply voltage for LVDS SYNC0+/- and SYNC1+/- (1.8 V) |
H3, J3 | VDDT1 | I | Supply voltage for SerDes termination. (1 V) |
B6 | VDDTX1 | I | Supply voltage for divided clock output. (1 V) |
B7 | VDDTX18 | I | Supply voltage for divided clock output . (1.8 V) |
D10, E10, K10, L10 | VEE18N | I | Analog supply voltage. (-1.8 V) |
L12 | VOUT1+ | O | DAC channel 1 output. |
K12 | VOUT1- | O | DAC channel 1 complementary output. |
D12 | VOUT2+ | O | DAC channel 2 output. |
E12 | VOUT2- | O | DAC channel 2 complementary output. |
D4 | VSENSE | O | Test pin for on chip parametrics. Can be left floating. |
A8, A11, B8, B11, B12, F8, F9, F10, J8, J9, J10 | VSSCLK | - | Clock ground. |
MIN | MAX | UNIT | ||
---|---|---|---|---|
Supply Voltage Range(2) | VDDDAC1, VDDDIG1, VDDL1_1, VDDL2_1, VDDCLK1, VDDT1, VDDCLK1, VDDTX1, VDDE1 | –0.3 | 1.3 | V |
VDDR18, VDDIO18, VDDS18, VDDAPLL18, VDDAREF18, VDDAOUT18, VDDA18, VDDAVCO18, VDDTX18 | –0.3 | 2.45 | V | |
VEE18N | –2 | 0.3 | V | |
Voltage between AGND and DGND | –0.3 | 0.3 | V | |
Pin Voltage Range(2) | RX[0..7]+/- | –0.5 | VDDDIG1 + 0.5 V | V |
SDEN, SCLK, SDIO, SDO, TXENABLE, ALARM, RESET, SLEEP, TMS, TCLK, TDI, TDO, TRST, TESTMODE, GPI0, GPI1, GPO0, GPO1 | –0.5 | VDDIO + 0.5 V | V | |
CLKOUT+/- | –0.5 | VDDTX18 + 0.5 V | V | |
DACCLK+/-, SYSREF+/-, DACCLKSE | –0.5 | VDDCLK1 + 0.5 V | V | |
SYNC0+/-, SYNC1+/- | –0.5 | VDDS18 + 0.5 V | V | |
IOUT1+/-, IOUT2+/- | –0.5 | VDDAOUT18 + 0.5 V | V | |
RBIAS, EXTIO, ATEST | –0.5 | VDDAOUT18 + 0.5 V | V | |
IFORCE, VSENSE | –0.5 | VDDDIG1 + 0.5 V | V | |
AMUX1, AMUX0 | –0.5 | VDDT1 + 0.5 V | V | |
Peak input current (any input) | 20 | mA | ||
Peak total input current (all inputs) | –30 | mA | ||
Junction temperature TJ(3) | 150 | °C | ||
Operating free-air temperature, TA | –40 | 85 | °C | |
Storage temperature, Tstg | –65 | 150 | °C |