1 Overview

This document contains information for the ISOM811x-Q1 (DFG, DFH, and DFS packages) to aid in a functional safety system design. Information provided are:

• Functional safety failure in time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
• Component failure modes and their distribution (FMD) based on the primary function of the device
• Pin failure mode analysis (pin FMA)

Figure 1-1 and Figure 1-2 show the device functional block diagrams for reference.

Figure 1-1 ISOM811(0-3)-Q1 Functional Block Diagram

Figure 1-2 ISOM811(5-8)-Q1 Functional Block Diagram

The ISOM811x-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.