SFFS044A January 2021 – July 2026 TPS2HB16-Q1
The failure mode distribution estimation for the TPS2HB16-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| VOUT open (Hi-Z) | 20 |
| VOUT stuck on (VBB) | 10 |
| VOUT functional, not in specification – voltage or timing | 45 |
| Diagnostics not in specification | 10 |
| Protect functions fail to trip | 10 |
| Pin to pin short any two pins | 5 |