ZHCS864M April   2009  – January 2019 TMS320F28030 , TMS320F28031 , TMS320F28032 , TMS320F28033 , TMS320F28034 , TMS320F28035

PRODUCTION DATA.  

  1. 1器件概述
    1. 1.1 特性
    2. 1.2 应用
    3. 1.3 说明
    4. 1.4 功能方框图
  2. 2修订历史记录
  3. 3Device Comparison
    1. 3.1 Related Products
  4. 4Terminal Configuration and Functions
    1. 4.1 Pin Diagrams
    2. 4.2 Signal Descriptions
      1. Table 4-1 Signal Descriptions
  5. 5Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings – Automotive
    3. 5.3  ESD Ratings – Commercial
    4. 5.4  Recommended Operating Conditions
    5. 5.5  Power Consumption Summary
      1. Table 5-1 TMS320F2803x Current Consumption at 60-MHz SYSCLKOUT
      2. 5.5.1     Reducing Current Consumption
      3. 5.5.2     Current Consumption Graphs (VREG Enabled)
    6. 5.6  Electrical Characteristics
    7. 5.7  Thermal Resistance Characteristics
      1. 5.7.1 PN Package
      2. 5.7.2 PAG Package
      3. 5.7.3 RSH Package
    8. 5.8  Thermal Design Considerations
    9. 5.9  Emulator Connection Without Signal Buffering for the MCU
    10. 5.10 Parameter Information
      1. 5.10.1 Timing Parameter Symbology
      2. 5.10.2 General Notes on Timing Parameters
    11. 5.11 Test Load Circuit
    12. 5.12 Power Sequencing
      1. Table 5-3 Reset (XRS) Timing Requirements
      2. Table 5-4 Reset (XRS) Switching Characteristics
    13. 5.13 Clock Specifications
      1. 5.13.1 Device Clock Table
        1. Table 5-5 2803x Clock Table and Nomenclature (60-MHz Devices)
        2. Table 5-6 Device Clocking Requirements/Characteristics
        3. Table 5-7 Internal Zero-Pin Oscillator (INTOSC1/INTOSC2) Characteristics
      2. 5.13.2 Clock Requirements and Characteristics
        1. Table 5-8  XCLKIN Timing Requirements – PLL Enabled
        2. Table 5-9  XCLKIN Timing Requirements – PLL Disabled
        3. Table 5-10 XCLKOUT Switching Characteristics (PLL Bypassed or Enabled)
    14. 5.14 Flash Timing
      1. Table 5-11 Flash/OTP Endurance for T Temperature Material
      2. Table 5-12 Flash/OTP Endurance for S Temperature Material
      3. Table 5-13 Flash/OTP Endurance for Q Temperature Material
      4. Table 5-14 Flash Parameters at 60-MHz SYSCLKOUT
      5. Table 5-15 Flash/OTP Access Timing
      6. Table 5-16 Flash Data Retention Duration
  6. 6Detailed Description
    1. 6.1 Overview
      1. 6.1.1  CPU
      2. 6.1.2  Control Law Accelerator (CLA)
      3. 6.1.3  Memory Bus (Harvard Bus Architecture)
      4. 6.1.4  Peripheral Bus
      5. 6.1.5  Real-Time JTAG and Analysis
      6. 6.1.6  Flash
      7. 6.1.7  M0, M1 SARAMs
      8. 6.1.8  L0 SARAM, and L1, L2, and L3 DPSARAMs
      9. 6.1.9  Boot ROM
        1. 6.1.9.1 Emulation Boot
        2. 6.1.9.2 GetMode
        3. 6.1.9.3 Peripheral Pins Used by the Bootloader
      10. 6.1.10 Security
      11. 6.1.11 Peripheral Interrupt Expansion (PIE) Block
      12. 6.1.12 External Interrupts (XINT1–XINT3)
      13. 6.1.13 Internal Zero Pin Oscillators, Oscillator, and PLL
      14. 6.1.14 Watchdog
      15. 6.1.15 Peripheral Clocking
      16. 6.1.16 Low-power Modes
      17. 6.1.17 Peripheral Frames 0, 1, 2, 3 (PFn)
      18. 6.1.18 General-Purpose Input/Output (GPIO) Multiplexer
      19. 6.1.19 32-Bit CPU-Timers (0, 1, 2)
      20. 6.1.20 Control Peripherals
      21. 6.1.21 Serial Port Peripherals
    2. 6.2 Memory Maps
    3. 6.3 Register Maps
    4. 6.4 Device Emulation Registers
    5. 6.5 VREG/BOR/POR
      1. 6.5.1 On-chip Voltage Regulator (VREG)
        1. 6.5.1.1 Using the On-chip VREG
        2. 6.5.1.2 Disabling the On-chip VREG
      2. 6.5.2 On-chip Power-On Reset (POR) and Brown-Out Reset (BOR) Circuit
    6. 6.6 System Control
      1. 6.6.1 Internal Zero Pin Oscillators
      2. 6.6.2 Crystal Oscillator Option
      3. 6.6.3 PLL-Based Clock Module
      4. 6.6.4 Loss of Input Clock (NMI Watchdog Function)
      5. 6.6.5 CPU-Watchdog Module
    7. 6.7 Low-power Modes Block
    8. 6.8 Interrupts
      1. 6.8.1 External Interrupts
        1. 6.8.1.1 External Interrupt Electrical Data/Timing
          1. Table 6-22 External Interrupt Timing Requirements
          2. Table 6-23 External Interrupt Switching Characteristics
    9. 6.9 Peripherals
      1. 6.9.1  Control Law Accelerator (CLA) Overview
      2. 6.9.2  Analog Block
        1. 6.9.2.1 Analog-to-Digital Converter (ADC)
          1. 6.9.2.1.1 Features
          2. 6.9.2.1.2 ADC Start-of-Conversion Electrical Data/Timing
            1. Table 6-28 External ADC Start-of-Conversion Switching Characteristics
          3. 6.9.2.1.3 On-Chip Analog-to-Digital Converter (ADC) Electrical Data/Timing
            1. Table 6-29  ADC Electrical Characteristics
            2. Table 6-30  ADC Power Modes
            3. 6.9.2.1.3.1 Internal Temperature Sensor
              1. Table 6-31 Temperature Sensor Coefficient
            4. 6.9.2.1.3.2 ADC Power-Up Control Bit Timing
              1. Table 6-32 ADC Power-Up Delays
            5. 6.9.2.1.3.3 ADC Sequential and Simultaneous Timings
        2. 6.9.2.2 ADC MUX
        3. 6.9.2.3 Comparator Block
          1. 6.9.2.3.1 On-Chip Comparator/DAC Electrical Data/Timing
            1. Table 6-34 Electrical Characteristics of the Comparator/DAC
      3. 6.9.3  Detailed Descriptions
      4. 6.9.4  Serial Peripheral Interface (SPI) Module
        1. 6.9.4.1 SPI Master Mode Electrical Data/Timing
          1. Table 6-37 SPI Master Mode External Timing (Clock Phase = 0)
          2. Table 6-38 SPI Master Mode External Timing (Clock Phase = 1)
        2. 6.9.4.2 SPI Slave Mode Electrical Data/Timing
          1. Table 6-39 SPI Slave Mode External Timing (Clock Phase = 0)
          2. Table 6-40 SPI Slave Mode External Timing (Clock Phase = 1)
      5. 6.9.5  Serial Communications Interface (SCI) Module
      6. 6.9.6  Local Interconnect Network (LIN)
      7. 6.9.7  Enhanced Controller Area Network (eCAN) Module
      8. 6.9.8  Inter-Integrated Circuit (I2C)
        1. 6.9.8.1 I2C Electrical Data/Timing
          1. Table 6-46 I2C Timing Requirements
          2. Table 6-47 I2C Switching Characteristics
      9. 6.9.9  Enhanced PWM Modules (ePWM1/2/3/4/5/6/7)
        1. 6.9.9.1 ePWM Electrical Data/Timing
          1. Table 6-50 ePWM Timing Requirements
          2. Table 6-51 ePWM Switching Characteristics
        2. 6.9.9.2 Trip-Zone Input Timing
          1. Table 6-52 Trip-Zone Input Timing Requirements
      10. 6.9.10 High-Resolution PWM (HRPWM)
        1. 6.9.10.1 HRPWM Electrical Data/Timing
          1. Table 6-53 High-Resolution PWM Characteristics
      11. 6.9.11 Enhanced Capture Module (eCAP1)
        1. 6.9.11.1 eCAP Electrical Data/Timing
          1. Table 6-55 Enhanced Capture (eCAP) Timing Requirement
          2. Table 6-56 eCAP Switching Characteristics
      12. 6.9.12 High-Resolution Capture (HRCAP) Module
        1. 6.9.12.1 HRCAP Electrical Data/Timing
          1. Table 6-58 High-Resolution Capture (HRCAP) Timing Requirements
      13. 6.9.13 Enhanced Quadrature Encoder Pulse (eQEP)
        1. 6.9.13.1 eQEP Electrical Data/Timing
          1. Table 6-60 Enhanced Quadrature Encoder Pulse (eQEP) Timing Requirements
          2. Table 6-61 eQEP Switching Characteristics
      14. 6.9.14 JTAG Port
      15. 6.9.15 General-Purpose Input/Output (GPIO) MUX
        1. 6.9.15.1 GPIO Electrical Data/Timing
          1. 6.9.15.1.1 GPIO - Output Timing
            1. Table 6-67 General-Purpose Output Switching Characteristics
          2. 6.9.15.1.2 GPIO - Input Timing
            1. Table 6-68 General-Purpose Input Timing Requirements
          3. 6.9.15.1.3 Sampling Window Width for Input Signals
          4. 6.9.15.1.4 Low-Power Mode Wakeup Timing
            1. Table 6-69 IDLE Mode Timing Requirements
            2. Table 6-70 IDLE Mode Switching Characteristics
            3. Table 6-71 STANDBY Mode Timing Requirements
            4. Table 6-72 STANDBY Mode Switching Characteristics
            5. Table 6-73 HALT Mode Timing Requirements
            6. Table 6-74 HALT Mode Switching Characteristics
  7. 7Applications, Implementation, and Layout
    1. 7.1 TI Design or Reference Design
  8. 8器件和文档支持
    1. 8.1 使用入门
    2. 8.2 器件和开发支持工具命名规则
    3. 8.3 工具与软件
    4. 8.4 文档支持
    5. 8.5 相关链接
    6. 8.6 Community Resources
    7. 8.7 商标
    8. 8.8 静电放电警告
    9. 8.9 Glossary
  9. 9机械、封装和可订购信息
    1. 9.1 封装信息

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

8.2 器件和开发支持工具命名规则

为了标明产品开发周期的阶段，TI 为所有 TMS320™MCU 器件和支持工具的部件号指定前缀。每个 TMS320 MCU 商用系列成员产品均具有以下三个前缀中的一个：TMX、TMP 或者 TMS（例如，TMS320F28032）。德州仪器 (TI) 建议为其支持的工具使用三个可能前缀指示符中的两个：TMDX 和 TMDS。这些前缀代表了产品开发的发展阶段，即从工程原型 (TMX/TMDX) 直到完全合格的生产器件/工具 (TMS/TMDS)。

器件开发进化流程：

TMX 试验器件，不一定代表最终器件的电气规格
TMP 最终硅片，符合器件的电气规格，但是未完成质量和可靠性验证
TMS 完全合格的生产器件

支持工具开发发展流程：

TMDX 还未经完整的德州仪器 (TI) 内部质量测试的开发支持工具
TMDS 完全合格的开发支持产品

TMX 和 TMP 器件和 TMDX 开发支持工具出货时带有如下的免责声明：
“开发产品用于内部评估用途。”

TMS 器件和 TMDS 开发支持工具已进行完全特性描述，并且器件的质量和可靠性已经完全论证。TI 的标准保修证书适用。

预测显示原型器件（TMX 或者 TMP）的故障率大于标准生产器件。由于它们的预计的最终使用故障率仍未定义，德州仪器建议不要将这些器件用于任何生产系统。只有合格的产品器件将被使用。

TI 器件的命名规则还包括一个带有器件系列名称的后缀。这个后缀表示封装类型（例如，PN）和温度范围（例如，T）。Figure 8-1 提供了解读任一系列产品成员完整器件名称的图例。

要获取器件部件号以及更多订购信息，请访问 TI 网站 (www.ti.com.cn) 或者联系您的 TI 销售代表。

有关裸片器件命名规则标记的其他 说明 ，请参阅《TMS320F2803x Piccolo™ MCU 器件勘误表》。

TMS320F28030 TMS320F28031 TMS320F28032 TMS320F28033 TMS320F28034 TMS320F28035 devnom_b_prs584.gif
A. 有关特定器件的外设、温度和封装可用性的更多信息，请参阅 Table 3-1。
Figure 8-1 器件命名规则