ZHCSTD3B June   2022  – October 2023 BQ756506-Q1

PRODUCTION DATA  

  1.   1
  2. 特性
  3. 应用
  4. 说明
  5. Revision History
  6. 说明(续)
  7. Pin Configuration and Functions
  8. Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Timing Requirements
    7. 7.7 Typical Characteristics
  9. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Power Supplies
        1. 8.3.1.1 AVAO_REF and AVDD_REF
        2. 8.3.1.2 LDOIN
        3. 8.3.1.3 AVDD
        4. 8.3.1.4 DVDD
        5. 8.3.1.5 CVDD and NEG5V
        6. 8.3.1.6 TSREF
      2. 8.3.2 Measurement System
        1. 8.3.2.1 Main ADC
          1. 8.3.2.1.1 Cell Voltage Measurements
            1. 8.3.2.1.1.1 Analog Front End
            2. 8.3.2.1.1.2 VC Channel Measurements
            3. 8.3.2.1.1.3 Post-ADC Digital LPF
            4. 8.3.2.1.1.4 SRP and SRN Measurements
          2. 8.3.2.1.2 Temperature Measurements
            1. 8.3.2.1.2.1 DieTemp1 Measurement
            2. 8.3.2.1.2.2 GPIOs and TSREF Measurements
          3. 8.3.2.1.3 Main ADC Operation Control
            1. 8.3.2.1.3.1 Operation Modes and Status
        2. 8.3.2.2 AUX ADC
          1. 8.3.2.2.1 AUX Cell Voltage Measurements
            1. 8.3.2.2.1.1 AUX Analog Front End
            2. 8.3.2.2.1.2 CB and Current Sense Channel Measurements
          2. 8.3.2.2.2 AUX Temperature Measurements
            1. 8.3.2.2.2.1 DieTemp2 Measurement
            2. 8.3.2.2.2.2 AUX GPIO Measurements
          3. 8.3.2.2.3 MISC Measurements
          4. 8.3.2.2.4 AUX ADC Operation Control
        3. 8.3.2.3 Synchronization Between MAIN and AUX ADC Measurements
        4. 8.3.2.4 CS ADC
      3. 8.3.3 Cell Balancing
        1. 8.3.3.1 Set Up Cell Balancing
          1. 8.3.3.1.1 Step 1: Determine Balancing Channels
          2. 8.3.3.1.2 Step 2: Select Balancing Control Methods
          3. 8.3.3.1.3 Step 3a: Balancing Thermal Management
          4. 8.3.3.1.4 Step 3b: Option to Stop On Cell Voltage Threshold
          5. 8.3.3.1.5 Step 3c: Option to Stop at Fault
        2. 8.3.3.2 Cell Balancing in SLEEP Mode
        3. 8.3.3.3 Pause and Stop Cell Balancing
          1. 8.3.3.3.1 Cell Balancing Pause
          2. 8.3.3.3.2 Cell Balancing Stop
          3. 8.3.3.3.3 Remaining CB Time
      4. 8.3.4 Integrated Hardware Protectors
        1. 8.3.4.1 OVUV Protectors
          1. 8.3.4.1.1 OVUV Operation Modes
          2. 8.3.4.1.2 OVUV Control and Status
            1. 8.3.4.1.2.1 OVUV Control
            2. 8.3.4.1.2.2 OVUV Status
        2. 8.3.4.2 OTUT Protector
          1. 8.3.4.2.1 OTUT Operation Modes
          2. 8.3.4.2.2 OTUT Control and Status
            1. 8.3.4.2.2.1 OTUT Control
            2. 8.3.4.2.2.2 OTUT Status
      5. 8.3.5 GPIO Configuration
      6. 8.3.6 Communication, OTP, Diagnostic Control
        1. 8.3.6.1 Communication
          1. 8.3.6.1.1 Serial Interface
            1. 8.3.6.1.1.1 UART Physical Layer
              1. 8.3.6.1.1.1.1 UART Transmitter
              2. 8.3.6.1.1.1.2 UART Receiver
              3. 8.3.6.1.1.1.3 COMM CLEAR
            2. 8.3.6.1.1.2 Command and Response Protocol
              1. 8.3.6.1.1.2.1 Transaction Frame Structure
                1. 8.3.6.1.1.2.1.1 Frame Initialization Byte
                2. 8.3.6.1.1.2.1.2 Device Address Byte
                3. 8.3.6.1.1.2.1.3 Register Address Bytes
                4. 8.3.6.1.1.2.1.4 Data Bytes
                5. 8.3.6.1.1.2.1.5 CRC Bytes
                6. 8.3.6.1.1.2.1.6 Calculating Frame CRC Value
                7. 8.3.6.1.1.2.1.7 Verifying Frame CRC
              2. 8.3.6.1.1.2.2 Transaction Frame Examples
                1. 8.3.6.1.1.2.2.1 Single Device Read/Write
          2. 8.3.6.1.2 Communication Timeout
            1. 8.3.6.1.2.1 Short Communication Timeout
            2. 8.3.6.1.2.2 Long Communication Timeout
          3. 8.3.6.1.3 SPI Controller
          4. 8.3.6.1.4 SPI Loopback
        2. 8.3.6.2 Fault Handling
          1. 8.3.6.2.1 Fault Status Hierarchy
            1. 8.3.6.2.1.1 Debug Registers
          2. 8.3.6.2.2 Fault Masking and Reset
            1. 8.3.6.2.2.1 Fault Masking
            2. 8.3.6.2.2.2 Fault Reset
          3. 8.3.6.2.3 Fault Signaling
        3. 8.3.6.3 Nonvolatile Memory
          1. 8.3.6.3.1 OTP Page Status
          2. 8.3.6.3.2 OTP Programming
        4. 8.3.6.4 Diagnostic Control/Status
          1. 8.3.6.4.1 Power Supplies Check
            1. 8.3.6.4.1.1 Power Supply Diagnostic Check
            2. 8.3.6.4.1.2 Power Supply BIST
          2. 8.3.6.4.2 Thermal Shutdown and Warning Check
            1. 8.3.6.4.2.1 Thermal Shutdown
            2. 8.3.6.4.2.2 Thermal Warning
          3. 8.3.6.4.3 Oscillators Watchdog
          4. 8.3.6.4.4 OTP Error Check
            1. 8.3.6.4.4.1 OTP CRC Test and Faults
            2. 8.3.6.4.4.2 OTP Margin Read
            3. 8.3.6.4.4.3 Error Check and Correct (ECC) OTP
          5. 8.3.6.4.5 Integrated Hardware Protector Check
            1. 8.3.6.4.5.1 Parity Check
            2. 8.3.6.4.5.2 OVUV and OTUT DAC Check
            3. 8.3.6.4.5.3 OVUV Protector BIST
            4. 8.3.6.4.5.4 OTUT Protector BIST
          6. 8.3.6.4.6 Diagnostic Through ADC Comparison
            1. 8.3.6.4.6.1 Cell Voltage Measurement Check
            2. 8.3.6.4.6.2 Temperature Measurement Check
            3. 8.3.6.4.6.3 Cell Balancing FETs Check
            4. 8.3.6.4.6.4 VC and CB Open Wire Check
    4. 8.4 Device Functional Modes
      1. 8.4.1 Power Modes
        1. 8.4.1.1 SHUTDOWN Mode
          1. 8.4.1.1.1 Exit SHUTDOWN Mode
          2. 8.4.1.1.2 Enter SHUTDOWN Mode
        2. 8.4.1.2 SLEEP Mode
          1. 8.4.1.2.1 Exit SLEEP Mode
          2. 8.4.1.2.2 Enter SLEEP Mode
        3. 8.4.1.3 ACTIVE Mode
          1. 8.4.1.3.1 Exit ACTIVE Mode
          2. 8.4.1.3.2 Enter ACTIVE Mode From SHUTDOWN Mode
          3. 8.4.1.3.3 Enter ACTIVE Mode From SLEEP Mode
      2. 8.4.2 Device Reset
      3. 8.4.3 Ping
        1. 8.4.3.1 Ping
    5. 8.5 Register Maps
      1. 8.5.1 OTP Shadow Register Summary
      2. 8.5.2 Read/Write Register Summary
      3. 8.5.3 Read-Only Register Summary
      4. 8.5.4 Register Field Descriptions
        1. 8.5.4.1  Device Addressing Setup
          1. 8.5.4.1.1 DIR0_ADDR_OTP
          2. 8.5.4.1.2 DIR1_ADDR_OTP
          3. 8.5.4.1.3 CUST_MISC1 through CUST_MISC8
          4. 8.5.4.1.4 DIR0_ADDR
          5. 8.5.4.1.5 DIR1_ADDR
        2. 8.5.4.2  Device ID and Scratch Pad
          1. 8.5.4.2.1 PARTID
          2. 8.5.4.2.2 DEV_REVID
          3. 8.5.4.2.3 DIE_ID1 through DIE_ID9
        3. 8.5.4.3  General Configuration and Control
          1. 8.5.4.3.1  DEV_CONF
          2. 8.5.4.3.2  ACTIVE_CELL
          3. 8.5.4.3.3  PWR_TRANSIT_CONF
          4. 8.5.4.3.4  COMM_TIMEOUT_CONF
          5. 8.5.4.3.5  TX_HOLD_OFF
          6. 8.5.4.3.6  COMM_CTRL
          7. 8.5.4.3.7  CONTROL1
          8. 8.5.4.3.8  CONTROL2
          9. 8.5.4.3.9  CUST_CRC_HI
          10. 8.5.4.3.10 CUST_CRC_LO
          11. 8.5.4.3.11 CUST_CRC_RSLT_HI
          12. 8.5.4.3.12 CUST_CRC_RSLT_LO
        4. 8.5.4.4  Operation Status
          1. 8.5.4.4.1 DIAG_STAT
          2. 8.5.4.4.2 ADC_STAT1
          3. 8.5.4.4.3 ADC_STAT2
          4. 8.5.4.4.4 GPIO_STAT
          5. 8.5.4.4.5 BAL_STAT
          6. 8.5.4.4.6 DEV_STAT
        5. 8.5.4.5  ADC Configuration and Control
          1. 8.5.4.5.1  ADC_CONF1
          2. 8.5.4.5.2  ADC_CONF2
          3. 8.5.4.5.3  MAIN_ADC_CAL1
          4. 8.5.4.5.4  MAIN_ADC_CAL2
          5. 8.5.4.5.5  AUX_ADC_CAL1
          6. 8.5.4.5.6  AUX_ADC_CAL2
          7. 8.5.4.5.7  CS_ADC_CAL1
          8. 8.5.4.5.8  CS_ADC_CAL2
          9. 8.5.4.5.9  ADC_CTRL1
          10. 8.5.4.5.10 ADC_CTRL2
          11. 8.5.4.5.11 ADC_CTRL3
        6. 8.5.4.6  ADC Measurement Results
          1. 8.5.4.6.1  VCELL6_HI/LO
          2. 8.5.4.6.2  VCELL5_HI/LO
          3. 8.5.4.6.3  VCELL4_HI/LO
          4. 8.5.4.6.4  VCELL3_HI/LO
          5. 8.5.4.6.5  VCELL2_HI/LO
          6. 8.5.4.6.6  VCELL1_HI/LO
          7. 8.5.4.6.7  MAIN_CURRENT_HI/LO
          8. 8.5.4.6.8  CURRENT_HI/MID/LO
          9. 8.5.4.6.9  TSREF_HI/LO
          10. 8.5.4.6.10 GPIO1_HI/LO
          11. 8.5.4.6.11 GPIO2_HI/LO
          12. 8.5.4.6.12 GPIO3_HI/LO
          13. 8.5.4.6.13 GPIO4_HI/LO
          14. 8.5.4.6.14 GPIO5_HI/LO
          15. 8.5.4.6.15 GPIO6_HI/LO
          16. 8.5.4.6.16 GPIO7_HI/LO
          17. 8.5.4.6.17 GPIO8_HI/LO
          18. 8.5.4.6.18 DIETEMP1_HI/LO
          19. 8.5.4.6.19 DIETEMP2_HI/LO
          20. 8.5.4.6.20 AUX_CELL_HI/LO
          21. 8.5.4.6.21 AUX_GPIO_HI/LO
          22. 8.5.4.6.22 AUX_BAT_HI/LO
          23. 8.5.4.6.23 AUX_REFL_HI/LO
          24. 8.5.4.6.24 AUX_VBG2_HI/LO
          25. 8.5.4.6.25 AUX_AVAO_REF_HI/LO
          26. 8.5.4.6.26 AUX_AVDD_REF_HI/LO
          27. 8.5.4.6.27 AUX_OV_DAC_HI/LO
          28. 8.5.4.6.28 AUX_UV_DAC_HI/LO
          29. 8.5.4.6.29 AUX_OT_OTCB_DAC_HI/LO
          30. 8.5.4.6.30 AUX_UT_DAC_HI/LO
          31. 8.5.4.6.31 AUX_VCBDONE_DAC_HI/LO
          32. 8.5.4.6.32 AUX_VCM_HI/LO
          33. 8.5.4.6.33 REFOVDAC_HI/LO
          34. 8.5.4.6.34 DIAG_MAIN_HI/LO
          35. 8.5.4.6.35 DIAG_AUX_HI/LO
        7. 8.5.4.7  Balancing Configuration, Control and Status
          1. 8.5.4.7.1 CB_CELL6_CTRL through CB_CELL1_CTRL
          2. 8.5.4.7.2 VCB_DONE_THRESH
          3. 8.5.4.7.3 OTCB_THRESH
          4. 8.5.4.7.4 BAL_CTRL1
          5. 8.5.4.7.5 BAL_CTRL2
          6. 8.5.4.7.6 BAL_CTRL3
          7. 8.5.4.7.7 CB_COMPLETE2
          8. 8.5.4.7.8 BAL_TIME
        8. 8.5.4.8  Protector Configuration and Control
          1. 8.5.4.8.1 OV_THRESH
          2. 8.5.4.8.2 UV_THRESH
          3. 8.5.4.8.3 UV_DISABLE2
          4. 8.5.4.8.4 OTUT_THRESH
          5. 8.5.4.8.5 OVUV_CTRL
          6. 8.5.4.8.6 OTUT_CTRL
        9. 8.5.4.9  GPIO Configuration
          1. 8.5.4.9.1 GPIO_CONF1
          2. 8.5.4.9.2 GPIO_CONF2
          3. 8.5.4.9.3 GPIO_CONF3
          4. 8.5.4.9.4 GPIO_CONF4
        10. 8.5.4.10 SPI Controller
          1. 8.5.4.10.1 SPI_CONF
          2. 8.5.4.10.2 SPI_EXE
          3. 8.5.4.10.3 SPI_TX3, SPI_TX2, and SPI_TX1
          4. 8.5.4.10.4 SPI_RX3, SPI_RX2, and SPI_RX1
        11. 8.5.4.11 Diagnostic Control
          1. 8.5.4.11.1 DIAG_OTP_CTRL
          2. 8.5.4.11.2 DIAG_COMM_CTRL
          3. 8.5.4.11.3 DIAG_PWR_CTRL
          4. 8.5.4.11.4 DIAG_CBFET_CTRL2
          5. 8.5.4.11.5 DIAG_COMP_CTRL1
          6. 8.5.4.11.6 DIAG_COMP_CTRL2
          7. 8.5.4.11.7 DIAG_COMP_CTRL3
          8. 8.5.4.11.8 DIAG_COMP_CTRL4
          9. 8.5.4.11.9 DIAG_PROT_CTRL
        12. 8.5.4.12 Fault Configuration and Reset
          1. 8.5.4.12.1 FAULT_MSK1
          2. 8.5.4.12.2 FAULT_MSK2
          3. 8.5.4.12.3 FAULT_RST1
          4. 8.5.4.12.4 FAULT_RST2
        13. 8.5.4.13 Fault Status
          1. 8.5.4.13.1  FAULT_SUMMARY
          2. 8.5.4.13.2  FAULT_COMM1
          3. 8.5.4.13.3  FAULT_OTP
          4. 8.5.4.13.4  FAULT_SYS
          5. 8.5.4.13.5  FAULT_PROT1
          6. 8.5.4.13.6  FAULT_PROT2
          7. 8.5.4.13.7  FAULT_OV2
          8. 8.5.4.13.8  FAULT_UV2
          9. 8.5.4.13.9  FAULT_OT
          10. 8.5.4.13.10 FAULT_UT
          11. 8.5.4.13.11 FAULT_COMP_GPIO
          12. 8.5.4.13.12 FAULT_COMP_VCCB2
          13. 8.5.4.13.13 FAULT_COMP_VCOW2
          14. 8.5.4.13.14 FAULT_COMP_CBOW2
          15. 8.5.4.13.15 FAULT_COMP_CBFET2
          16. 8.5.4.13.16 FAULT_COMP_MISC
          17. 8.5.4.13.17 FAULT_PWR1
          18. 8.5.4.13.18 FAULT_PWR2
          19. 8.5.4.13.19 FAULT_PWR3
        14. 8.5.4.14 Debug Control and Status
          1. 8.5.4.14.1 DEBUG_UART_RC
          2. 8.5.4.14.2 DEBUG_UART_RR_TR
          3. 8.5.4.14.3 DEBUG_UART_DISCARD
          4. 8.5.4.14.4 DEBUG_UART_VALID_HI/LO
          5. 8.5.4.14.5 DEBUG_OTP_SEC_BLK
          6. 8.5.4.14.6 DEBUG_OTP_DED_BLK
        15. 8.5.4.15 OTP Programming Control and Status
          1. 8.5.4.15.1 OTP_PROG_UNLOCK1A through OTP_PROG_UNLOCK1D
          2. 8.5.4.15.2 OTP_PROG_UNLOCK2A through OTP_PROG_UNLOCK2D
          3. 8.5.4.15.3 OTP_PROG_CTRL
          4. 8.5.4.15.4 OTP_ECC_TEST
          5. 8.5.4.15.5 OTP_ECC_DATAIN1 through OTP_ECC_DATAIN9
          6. 8.5.4.15.6 OTP_ECC_DATAOUT1 through OTP_ECC_DATAOUT9
          7. 8.5.4.15.7 OTP_PROG_STAT
          8. 8.5.4.15.8 OTP_CUST1_STAT
          9. 8.5.4.15.9 OTP_CUST2_STAT
  10. Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Applications
      1. 9.2.1 Application Circuits
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
          1. 9.2.1.2.1 Cell Sensing and Balancing Inputs
          2. 9.2.1.2.2 Synchronize Voltage and Current Measurements
          3. 9.2.1.2.3 BAT and External NPN
          4. 9.2.1.2.4 Power Supplies, Reference Input
          5. 9.2.1.2.5 GPIO For Thermistor Inputs
          6. 9.2.1.2.6 Internal Balancing Current
          7. 9.2.1.2.7 UART, NFAULT
          8. 9.2.1.2.8 Current Sense Input
        3. 9.2.1.3 Application Curve
  11. 10Power Supply Recommendations
  12. 11Layout
    1. 11.1 Layout Guidelines
      1. 11.1.1 Ground Planes
      2. 11.1.2 Bypass Capacitors for Power Supplies and Reference
      3. 11.1.3 Cell Voltage Sensing
    2. 11.2 Layout Example
  13. 12Device and Documentation Support
    1. 12.1 Device Support
      1. 12.1.1 第三方产品免责声明
    2. 12.2 接收文档更新通知
    3. 12.3 支持资源
    4. 12.4 Trademarks
    5. 12.5 静电放电警告
    6. 12.6 术语表
  14. 13Mechanical, Packaging, and Orderable Information

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)

说明

BQ756506-Q1 器件可在不到 200µs 的时间内提供高达 6S 电池模块的高精度电池电压测量,同时该器件还支持分流电阻器电流检测测量。借助集成式前端滤波器,可以在电池输入通道上使用简单、低额定电压的差分 RC 滤波器来实现系统。集成式后 ADC 低通滤波器可以执行经过滤波、类似于直流电的电压测量。该器件还支持集成电流检测功能,可选择与电池电压测量同步,以更好地计算荷电状态 (SOC)。此器件支持自主内部电池平衡,并通过监测温度来自动暂停和恢复平衡,以免出现过热条件。

器件信息
器件型号 (1)封装封装尺寸(标称值)
BQ756506-Q1HTQFP(64 引脚)10.00mm x 10.00mm
如需了解所有可用封装,请参阅数据表末尾的可订购产品附录。
GUID-20201123-CA0I-NVPR-BZKM-9SJH76J1NHCN-low.gif系统简图