产品详情

Technology family LVC Supply voltage (min) (V) 1.65 Supply voltage (max) (V) 6.5 Number of channels 1 IOL (max) (mA) 32 Supply current (max) (µA) 10 IOH (max) (mA) -32 Input type Schmitt-Trigger Output type Push-Pull Features Balanced outputs, Over-voltage tolerant inputs, Partial power down (Ioff), Very high speed (tpd 5-10ns) Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
Technology family LVC Supply voltage (min) (V) 1.65 Supply voltage (max) (V) 6.5 Number of channels 1 IOL (max) (mA) 32 Supply current (max) (µA) 10 IOH (max) (mA) -32 Input type Schmitt-Trigger Output type Push-Pull Features Balanced outputs, Over-voltage tolerant inputs, Partial power down (Ioff), Very high speed (tpd 5-10ns) Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
SOT-23 (DBV) 5 8.12 mm² 2.9 x 2.8 SOT-SC70 (DCK) 5 4.2 mm² 2 x 2.1
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Qualification Pedigree(1)
  • Supports 5-V VCC Operation
  • Max tpd of 4.6 ns at 3.3 V
  • Low Power Consumption, 10 µA Max ICC
  • ±24 mA Output Drive at 3.3 V
  • Ioff Supports Partial Power Down Mode Operation
  • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

NanoStar, NanoFree are trademarks of Texas Instruments.

  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Qualification Pedigree(1)
  • Supports 5-V VCC Operation
  • Max tpd of 4.6 ns at 3.3 V
  • Low Power Consumption, 10 µA Max ICC
  • ±24 mA Output Drive at 3.3 V
  • Ioff Supports Partial Power Down Mode Operation
  • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

NanoStar, NanoFree are trademarks of Texas Instruments.

This single Schmitt-trigger buffer is designed for 1.65-V to 5.5-V VCC operation.

The SN74LVC1G17 contains one buffer and performs the Boolean function Y = A. The device functions as an independent buffer, but because of Schmitt action, it may have different input threshold levels for positive-going (VT+) and negative-going (VT-) signals.

NanoStar™ and NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the package.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

This single Schmitt-trigger buffer is designed for 1.65-V to 5.5-V VCC operation.

The SN74LVC1G17 contains one buffer and performs the Boolean function Y = A. The device functions as an independent buffer, but because of Schmitt action, it may have different input threshold levels for positive-going (VT+) and negative-going (VT-) signals.

NanoStar™ and NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the package.

This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

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类型 标题 下载最新的英语版本 日期
* 数据表 Single Schmitt-Trigger Buffer 数据表 (Rev. A) 2007年 6月 29日
* VID SN74LVC1G17-EP VID V6206621 2016年 6月 21日
* 辐射与可靠性报告 SN74LVC1G17MDBVREP Reliability Report (Rev. A) 2012年 6月 6日
* 辐射与可靠性报告 SN74LVC1G17MDCKREP Reliability Report 2012年 5月 7日
应用手册 Implications of Slow or Floating CMOS Inputs (Rev. E) 2021年 7月 26日
选择指南 Little Logic Guide 2018 (Rev. G) 2018年 7月 6日
选择指南 Logic Guide (Rev. AB) 2017年 6月 12日
应用手册 How to Select Little Logic (Rev. A) 2016年 7月 26日
应用手册 Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 2015年 12月 2日
选择指南 逻辑器件指南 2014 (Rev. AA) 最新英语版本 (Rev.AB) 2014年 11月 17日
选择指南 小尺寸逻辑器件指南 (Rev. E) 最新英语版本 (Rev.G) 2012年 7月 16日
用户指南 LOGIC Pocket Data Book (Rev. B) 2007年 1月 16日
应用手册 CMOS 非缓冲反向器在振荡器电路中的使用 英语版 2006年 3月 23日
应用手册 选择正确的电平转换解决方案 (Rev. A) 英语版 (Rev.A) 2006年 3月 23日
产品概述 Design Summary for WCSP Little Logic (Rev. B) 2004年 11月 4日
应用手册 Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 2004年 7月 8日
用户指南 Signal Switch Data Book (Rev. A) 2003年 11月 14日
用户指南 LVC and LV Low-Voltage CMOS Logic Data Book (Rev. B) 2002年 12月 18日
应用手册 Texas Instruments Little Logic Application Report 2002年 11月 1日
应用手册 TI IBIS File Creation, Validation, and Distribution Processes 2002年 8月 29日
更多文献资料 Standard Linear & Logic for PCs, Servers & Motherboards 2002年 6月 13日
应用手册 16-Bit Widebus Logic Families in 56-Ball, 0.65-mm Pitch Very Thin Fine-Pitch BGA (Rev. B) 2002年 5月 22日
应用手册 Power-Up 3-State (PU3S) Circuits in TI Standard Logic Devices 2002年 5月 10日
更多文献资料 STANDARD LINEAR AND LOGIC FOR DVD/VCD PLAYERS 2002年 3月 27日
应用手册 Migration From 3.3-V To 2.5-V Power Supplies For Logic Devices 1997年 12月 1日
应用手册 Bus-Interface Devices With Output-Damping Resistors Or Reduced-Drive Outputs (Rev. A) 1997年 8月 1日
应用手册 CMOS Power Consumption and CPD Calculation (Rev. B) 1997年 6月 1日
应用手册 LVC Characterization Information 1996年 12月 1日
应用手册 Input and Output Characteristics of Digital Integrated Circuits 1996年 10月 1日
应用手册 Live Insertion 1996年 10月 1日
设计指南 Low-Voltage Logic (LVC) Designer's Guide 1996年 9月 1日
应用手册 Understanding Advanced Bus-Interface Products Design Guide 1996年 5月 1日

设计和开发

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封装 引脚 下载
SOT-23 (DBV) 5 查看选项
SOT-SC70 (DCK) 5 查看选项

订购和质量

包含信息:
  • RoHS
  • REACH
  • 器件标识
  • 引脚镀层/焊球材料
  • MSL 等级/回流焊峰值温度
  • MTBF/时基故障估算
  • 材料成分
  • 鉴定摘要
  • 持续可靠性监测
包含信息:
  • 制造厂地点
  • 封装厂地点

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