产品详情

Technology family LS Bits (#) 9 Rating Military Operating temperature range (°C) -55 to 125
Technology family LS Bits (#) 9 Rating Military Operating temperature range (°C) -55 to 125
CDIP (J) 14 130.4652 mm² 19.56 x 6.67 CFP (W) 14 58.023 mm² 9.21 x 6.3
  • Generates Either Odd or Even Parity for Nine Data Lines
  • Cascadable for n-Bits
  • Can Be Used to Upgrade Existing Systems using MSI Parity Circuits
  • Typical Data-to-Output Delay of Only 14 ns for 'S280 and 33 ns for 'LS280
  • Typical Power Dissipation:
    • 'LS280 … 80 mW
    • 'S280 … 335 mW

 

logic symbol

 

  • Generates Either Odd or Even Parity for Nine Data Lines
  • Cascadable for n-Bits
  • Can Be Used to Upgrade Existing Systems using MSI Parity Circuits
  • Typical Data-to-Output Delay of Only 14 ns for 'S280 and 33 ns for 'LS280
  • Typical Power Dissipation:
    • 'LS280 … 80 mW
    • 'S280 … 335 mW

 

logic symbol

 

These universal, monolithic, nine-bit parity generators/checkers utilize Schottky-clamped TTL high-performance circuitry and feature odd/even outputs to facilitate operation of either odd or even parity application. The word-length capability is easily expanded by cascading as shown under typical application data.

Series 54LS/74LS and Series 54S/74S parity generators/checkers offer the designer a trade-off between reduced power consumption and high performance. These devices can be used to upgrade the performance of most systems utilizing the '180 parity generator/checker. Although the 'LS280 and 'S280 are implemented without expander inputs, the corresponding function is provided by the availability of an input at pin 4 and the absence of any internal connection at pin 3. This permits the 'LS280 and 'S280 to be substituted for the '180 in existing designs to produce an identical function even if 'LS280's and 'S280's are mixed with existing '180's.

These devices are fully compatible with most other TTL circuits. All 'LS280 and 'S280 inputs are buffered to lower the drive requirements to one Series 54LS/74LS or Series 54S/74S standard load, respectively.

 

These universal, monolithic, nine-bit parity generators/checkers utilize Schottky-clamped TTL high-performance circuitry and feature odd/even outputs to facilitate operation of either odd or even parity application. The word-length capability is easily expanded by cascading as shown under typical application data.

Series 54LS/74LS and Series 54S/74S parity generators/checkers offer the designer a trade-off between reduced power consumption and high performance. These devices can be used to upgrade the performance of most systems utilizing the '180 parity generator/checker. Although the 'LS280 and 'S280 are implemented without expander inputs, the corresponding function is provided by the availability of an input at pin 4 and the absence of any internal connection at pin 3. This permits the 'LS280 and 'S280 to be substituted for the '180 in existing designs to produce an identical function even if 'LS280's and 'S280's are mixed with existing '180's.

These devices are fully compatible with most other TTL circuits. All 'LS280 and 'S280 inputs are buffered to lower the drive requirements to one Series 54LS/74LS or Series 54S/74S standard load, respectively.

 

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类型 标题 下载最新的英语版本 日期
* 数据表 9-Bit Odd/Even Parity Generators/Checkers 数据表 1988年 3月 1日
选择指南 Logic Guide (Rev. AB) 2017年 6月 12日
应用手册 Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 2015年 12月 2日
选择指南 逻辑器件指南 2014 (Rev. AA) 最新英语版本 (Rev.AB) 2014年 11月 17日
用户指南 LOGIC Pocket Data Book (Rev. B) 2007年 1月 16日
应用手册 Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 2004年 7月 8日
应用手册 TI IBIS File Creation, Validation, and Distribution Processes 2002年 8月 29日
应用手册 使用逻辑器件进行设计 (Rev. C) 1997年 6月 1日
应用手册 Designing with the SN54/74LS123 (Rev. A) 1997年 3月 1日
应用手册 Input and Output Characteristics of Digital Integrated Circuits 1996年 10月 1日
应用手册 Live Insertion 1996年 10月 1日

设计和开发

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封装 引脚 下载
CDIP (J) 14 查看选项
CFP (W) 14 查看选项

订购和质量

包含信息:
  • RoHS
  • REACH
  • 器件标识
  • 引脚镀层/焊球材料
  • MSL 等级/回流焊峰值温度
  • MTBF/时基故障估算
  • 材料成分
  • 鉴定摘要
  • 持续可靠性监测
包含信息:
  • 制造厂地点
  • 封装厂地点

支持和培训

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