The LMG341xR070 GaN power stage with integrated driver and protection enables designers to achieve new levels of power density and efficiency in power electronics systems. The LMG341x’s inherent advantages over silicon MOSFETs include ultra-low input and output capacitance, zero reverse recovery to reduce switching losses by as much as 80%, and low switch node ringing to reduce EMI. These advantages enable dense and efficient topologies like the totem-pole PFC.
The LMG341xR070 provides a smart alternative to traditional cascode GaN and standalone GaN FETs by integrating a unique set of features to simplify design, maximize reliability and optimize the performance of any power supply. Integrated gate drive enables 100V/ns switching with near zero Vds ringing, <100 ns current limiting self-protects against unintended shoot-through events, Overtemperature shutdown prevents thermal runaway, and system interface signals provide self-monitoring capability.
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|Prop Delay (ns)|
|Operating Temperature Range (C)|
|Package Size: mm2:W x L (PKG)|
|-40 to 125||-40 to 125||-40 to 125||-40 to 125|
|VQFN | 32||VQFN | 32||VQFN | 32||QFM | 9|
|32VQFN: 64 mm2: 8 x 8 (VQFN | 32)||32VQFN: 64 mm2: 8 x 8 (VQFN | 32)||32VQFN: 64 mm2: 8 x 8 (VQFN | 32)||See datasheet (QFM)|