SLAK026 March   2019 MSP430FR5969-SP

1.   Single-event Effects Test Report of the MSP430FR5969-SP
   1.     Trademarks
   2. 1 Overview
   3. 2 Microcontroller Characterization System Implementation
   4. 3 Key Considerations
      1. 3.1 Error Handling
      2. 3.2 MPU Configuration
      3. 3.3 Logical Concerns
      4. 3.4 Memory Map
   5. 4 Irradiation Facilities and Setup
   6. 5 Depth, Range, and LETEFF Calculation
   7. 6 SEE Definitions/Methodology
      1. 6.1 Testing Methodology
      2. 6.2 Program SEFI
      3. 6.3 Power SEFI
      4. 6.4 Error Detected SEU
      5. 6.5 Self Reset SEFI
      6. 6.6 Pre-Probe
   8. 7 Shutter Based Boot Protection Scheme
   9. 8 Test Setup
   10. 9 Results
       1. 9.1 Power SEFI
       2. 9.2 Error Detected SEU
       3. 9.3 Self Reset SEFI
       4. 9.4 Orbital Event Rate Calculations
2.   A Total Ionizing Dose From SEE Experiments
3.   B Confidence Interval Calculations
4.   C Orbital Environment Estimations
5.   D References