SLLA539B November 2020 – December 2021 TCAN1051-Q1 , TCAN1051G-Q1 , TCAN1051GV-Q1 , TCAN1051H-Q1 , TCAN1051HG-Q1 , TCAN1051HGV-Q1 , TCAN1051HV-Q1 , TCAN1051V-Q1
This section provides Functional Safety Failure In Time (FIT) rates for TCAN1051-Q1 and TCAN1051V-Q1 (as well as the TCAN1051H-Q1, TCAN1051G-Q1, TCAN1051HV-Q1, TCAN1051GV-Q1, TCAN1051HG-Q1 and TCAN1051HGV-Q1) based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) 8-pin SOIC (D) | FIT (Failures Per 109 Hours) 8-pin VSON (DRB) |
---|---|---|
Total Component FIT Rate | 12 | 6 |
Die FIT Rate | 4 | 2 |
Package FIT Rate | 8 | 4 |
The failure rate and mission profile information in Table 2-1 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS, BICMOS ASICs Analog & Mixed =<50V supply |
20 FIT | 55°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.