ZHCSFX5C December   2016  – December 2017 LMK60E0-156M , LMK60E0-212M , LMK60E2-100M , LMK60E2-125M , LMK60E2-156M , LMK60I2-100M , LMK60I2-322M

PRODUCTION DATA.  

  1. 特性
  2. 应用
  3. 说明
    1.     Device Images
      1.      引脚分配
  4. 修订历史记录
  5. Pin Configuration and Functions
    1.     Pin Functions
  6. Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics - Power Supply
    6. 6.6  LVPECL Output Characteristics
    7. 6.7  LVDS Output Characteristics
    8. 6.8  HCSL Output Characteristics
    9. 6.9  OE Input Characteristics
    10. 6.10 Frequency Tolerance Characteristics
    11. 6.11 Power-On/Reset Characteristics (VDD)
    12. 6.12 PSRR Characteristics
    13. 6.13 PLL Clock Output Jitter Characteristics
    14. 6.14 Additional Reliability and Qualification
  7. Parameter Measurement Information
    1. 7.1 Device Output Configurations
  8. Power Supply Recommendations
  9. Layout
    1. 9.1 Layout Guidelines
      1. 9.1.1 Ensuring Thermal Reliability
      2. 9.1.2 Best Practices for Signal Integrity
      3. 9.1.3 Recommended Solder Reflow Profile
  10. 10器件和文档支持
    1. 10.1 接收文档更新通知
    2. 10.2 社区资源
    3. 10.3 商标
    4. 10.4 静电放电警告
    5. 10.5 Glossary
  11. 11机械、封装和可订购信息

封装选项

请参考 PDF 数据表获取器件具体的封装图。

机械数据 (封装 | 引脚)
  • SIA|6
订购信息

Device Output Configurations

LMK60E2-100M LMK60E2-125M LMK60E2-156M LMK60E0-156M LMK60E0-212M LMK60I2-100M LMK60I2-322M lvpecl_output_dc_configuration_snas687.gifFigure 1. LVPECL Output DC Configuration During Device Test
LMK60E2-100M LMK60E2-125M LMK60E2-156M LMK60E0-156M LMK60E0-212M LMK60I2-100M LMK60I2-322M lvds_output_dc_configuration_snas687.gifFigure 2. LVDS Output DC Configuration During Device Test
LMK60E2-100M LMK60E2-125M LMK60E2-156M LMK60E0-156M LMK60E0-212M LMK60I2-100M LMK60I2-322M hcsl_output_dc_configuration_snas687.gifFigure 3. HCSL Output DC Configuration During Device Test (1)
LMK60E2-100M LMK60E2-125M LMK60E2-156M LMK60E0-156M LMK60E0-212M LMK60I2-100M LMK60I2-322M lvpecl_output_ac_configuration_snas687.gifFigure 4. LVPECL Output AC Configuration During Device Test
LMK60E2-100M LMK60E2-125M LMK60E2-156M LMK60E0-156M LMK60E0-212M LMK60I2-100M LMK60I2-322M lvds_output_ac_configuration_snas687.gifFigure 5. LVDS Output AC Configuration During Device Test
LMK60E2-100M LMK60E2-125M LMK60E2-156M LMK60E0-156M LMK60E0-212M LMK60I2-100M LMK60I2-322M hcsl_output_ac_configuration_snas687.gifFigure 6. HCSL Output AC Configuration During Device Test
LMK60E2-100M LMK60E2-125M LMK60E2-156M LMK60E0-156M LMK60E0-212M LMK60I2-100M LMK60I2-322M psrr_test_setup_snas687.gifFigure 7. PSRR Test Setup
LMK60E2-100M LMK60E2-125M LMK60E2-156M LMK60E0-156M LMK60E0-212M LMK60I2-100M LMK60I2-322M differential_output_voltage_rise_fall_time_snas674.gifFigure 8. Differential Output Voltage and Rise/Fall Time
Also compatible with 85 Ω termination