ZHCSIG4A July   2018  – June 2019 DLPC3434

PRODUCTION DATA.  

  1. 特性
  2. 应用
  3. 说明
    1.     Device Images
      1.      简化应用
  4. 修订历史记录
  5. Pin Configuration and Functions
    1.     Pin Functions – Board Level Test, Debug, and Initialization
    2.     Pin Functions – Parallel Port Input Data and Control
    3.     Pin Functions – DMD Reset and Bias Control
    4.     Pin Functions – DMD Sub-LVDS Interface
    5.     Pin Functions – Peripheral Interface
    6.     Pin Functions – GPIO Peripheral Interface
    7.     Pin Functions – Clock and PLL Support
    8.     Pin Functions – Power and Ground
  6. Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics over Recommended Operating Conditions
    6. 6.6  Electrical Characteristics
    7. 6.7  Internal Pullup and Pulldown Characteristics
    8. 6.8  High-Speed Sub-LVDS Electrical Characteristics
    9. 6.9  Low-Speed SDR Electrical Characteristics
    10. 6.10 System Oscillators Timing Requirements
    11. 6.11 Power-Up and Reset Timing Requirements
    12. 6.12 Parallel Interface Frame Timing Requirements
    13. 6.13 Parallel Interface General Timing Requirements
    14. 6.14 Flash Interface Timing Requirements
  7. Parameter Measurement Information
    1. 7.1 HOST_IRQ Usage Model
    2. 7.2 Input Frame Rates and 3-D Display Operation
      1. 7.2.1 Parallel Interface Data Transfer Format
  8. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1  Interface Timing Requirements
        1. 8.3.1.1 Parallel Interface
      2. 8.3.2  Serial Flash Interface
      3. 8.3.3  Tested Flash Devices
      4. 8.3.4  Serial Flash Programming
      5. 8.3.5  SPI Signal Routing
      6. 8.3.6  I2C Interface Performance
      7. 8.3.7  Content-Adaptive Illumination Control
      8. 8.3.8  Local Area Brightness Boost
      9. 8.3.9  3-D Glasses Operation
      10. 8.3.10 DMD (Sub-LVDS) Interface
      11. 8.3.11 Calibration and Debug Support
      12. 8.3.12 DMD Interface Considerations
    4. 8.4 Device Functional Modes
  9. Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curve
  10. 10Power Supply Recommendations
    1. 10.1 System Power-Up and Power-Down Sequence
    2. 10.2 DLPC3434 Power-Up Initialization Sequence
    3. 10.3 DMD Fast PARK Control (PARKZ)
    4. 10.4 Hot Plug Usage
    5. 10.5 Maximum Signal Transition Time
  11. 11Layout
    1. 11.1 Layout Guidelines
      1. 11.1.1  PCB Layout Guidelines for Internal ASIC PLL Power
      2. 11.1.2  DLPC3434 Reference Clock
        1. 11.1.2.1 Recommended Crystal Oscillator Configuration
      3. 11.1.3  General PCB Recommendations
      4. 11.1.4  General Handling Guidelines for Unused CMOS-Type Pins
      5. 11.1.5  Maximum Pin-to-Pin, PCB Interconnects Etch Lengths
      6. 11.1.6  Number of Layer Changes
      7. 11.1.7  Stubs
      8. 11.1.8  Terminations
      9. 11.1.9  Routing Vias
      10. 11.1.10 Thermal Considerations
    2. 11.2 Layout Example
  12. 12器件和文档支持
    1. 12.1 器件支持
      1. 12.1.1 第三方产品免责声明
      2. 12.1.2 器件命名规则
        1. 12.1.2.1 器件标记
      3. 12.1.3 视频时序参数定义
    2. 12.2 相关链接
    3. 12.3 社区资源
    4. 12.4 商标
    5. 12.5 静电放电警告
    6. 12.6 Glossary
  13. 13机械、封装和可订购信息
    1. 13.1 Package Option Addendum
      1. 13.1.1 Packaging Information

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

Absolute Maximum Ratings

over operating free-air temperature (unless otherwise noted)(1)
MIN MAX UNIT
SUPPLY VOLTAGE(2)(3)
V(VDD) (core) –0.3 1.21 V
V(VDDLP12) (core) –0.3 1.32 V
V(VCC18) (All 1.8-V Power + sub-LVDS) –0.3 1.96 V
V(VCC_INTF) Host I/O power –0.3 3.60 V
If 1.8-V power used –0.3 1.99
If 2.5-V power used –0.3 2.75
If 3.3-V power used –0.3 3.60
V(VCC_FLSH) Flash I/O power –0.3 3.60 V
If 1.8-V power used –0.3 1.96
If 2.5-V power used –0.3 2.72
If 3.3-V power used –0.3 3.58
V(VDD_PLLM) (MCG PLL) –0.3 1.21 V
V(VDD_PLLD) (1DCG PLL) –0.3 1.21 V
GENERAL
TJ Operating junction temperature –30 125 °C
Tstg Storage temperature –40 125 °C
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values are with respect to GND.
Overlap currents, if allowed to continue flowing unchecked, not only increase total power dissipation in a circuit, but degrade the circuit reliability, thus shortening its usual operating life.