ZHCSIG4A July   2018  – June 2019 DLPC3434

PRODUCTION DATA.  

  1. 特性
  2. 应用
  3. 说明
    1.     Device Images
      1.      简化应用
  4. 修订历史记录
  5. Pin Configuration and Functions
    1.     Pin Functions – Board Level Test, Debug, and Initialization
    2.     Pin Functions – Parallel Port Input Data and Control
    3.     Pin Functions – DMD Reset and Bias Control
    4.     Pin Functions – DMD Sub-LVDS Interface
    5.     Pin Functions – Peripheral Interface
    6.     Pin Functions – GPIO Peripheral Interface
    7.     Pin Functions – Clock and PLL Support
    8.     Pin Functions – Power and Ground
  6. Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics over Recommended Operating Conditions
    6. 6.6  Electrical Characteristics
    7. 6.7  Internal Pullup and Pulldown Characteristics
    8. 6.8  High-Speed Sub-LVDS Electrical Characteristics
    9. 6.9  Low-Speed SDR Electrical Characteristics
    10. 6.10 System Oscillators Timing Requirements
    11. 6.11 Power-Up and Reset Timing Requirements
    12. 6.12 Parallel Interface Frame Timing Requirements
    13. 6.13 Parallel Interface General Timing Requirements
    14. 6.14 Flash Interface Timing Requirements
  7. Parameter Measurement Information
    1. 7.1 HOST_IRQ Usage Model
    2. 7.2 Input Frame Rates and 3-D Display Operation
      1. 7.2.1 Parallel Interface Data Transfer Format
  8. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1  Interface Timing Requirements
        1. 8.3.1.1 Parallel Interface
      2. 8.3.2  Serial Flash Interface
      3. 8.3.3  Tested Flash Devices
      4. 8.3.4  Serial Flash Programming
      5. 8.3.5  SPI Signal Routing
      6. 8.3.6  I2C Interface Performance
      7. 8.3.7  Content-Adaptive Illumination Control
      8. 8.3.8  Local Area Brightness Boost
      9. 8.3.9  3-D Glasses Operation
      10. 8.3.10 DMD (Sub-LVDS) Interface
      11. 8.3.11 Calibration and Debug Support
      12. 8.3.12 DMD Interface Considerations
    4. 8.4 Device Functional Modes
  9. Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curve
  10. 10Power Supply Recommendations
    1. 10.1 System Power-Up and Power-Down Sequence
    2. 10.2 DLPC3434 Power-Up Initialization Sequence
    3. 10.3 DMD Fast PARK Control (PARKZ)
    4. 10.4 Hot Plug Usage
    5. 10.5 Maximum Signal Transition Time
  11. 11Layout
    1. 11.1 Layout Guidelines
      1. 11.1.1  PCB Layout Guidelines for Internal ASIC PLL Power
      2. 11.1.2  DLPC3434 Reference Clock
        1. 11.1.2.1 Recommended Crystal Oscillator Configuration
      3. 11.1.3  General PCB Recommendations
      4. 11.1.4  General Handling Guidelines for Unused CMOS-Type Pins
      5. 11.1.5  Maximum Pin-to-Pin, PCB Interconnects Etch Lengths
      6. 11.1.6  Number of Layer Changes
      7. 11.1.7  Stubs
      8. 11.1.8  Terminations
      9. 11.1.9  Routing Vias
      10. 11.1.10 Thermal Considerations
    2. 11.2 Layout Example
  12. 12器件和文档支持
    1. 12.1 器件支持
      1. 12.1.1 第三方产品免责声明
      2. 12.1.2 器件命名规则
        1. 12.1.2.1 器件标记
      3. 12.1.3 视频时序参数定义
    2. 12.2 相关链接
    3. 12.3 社区资源
    4. 12.4 商标
    5. 12.5 静电放电警告
    6. 12.6 Glossary
  13. 13机械、封装和可订购信息
    1. 13.1 Package Option Addendum
      1. 13.1.1 Packaging Information

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

Calibration and Debug Support

The DLPC3434 contains a test point output port, TSTPT_(7:0), which provides selected system calibration support as well as ASIC debug support. These test points are inputs while reset is applied and switch to outputs when reset is released. The state of these signals is sampled upon the release of system reset and the captured value configures the test mode until the next time reset is applied. Each test point includes an internal pulldown resistor, thus external pullups must be used to modify the default test configuration. The default configuration (x000) corresponds to the TSTPT_(7:0) outputs remaining tri-stated to reduce switching activity during normal operation. For maximum flexibility, an option to jumper to an external pullup is recommended for TSTPT_(2:0). Pullups on TSTPT_(6:3) are used to configure the ASIC for a specific mode or option. TI does not recommend adding pullups to TSTPT_(7:3) because this has adverse affects for normal operation. This external pullup is only sampled upon a 0-to-1 transition on the RESETZ input, thus changing their configuration after reset is released will not have any effect until the next time reset is asserted and released. Table 8 defines the test mode selection for one programmable scenario defined by TSTPT(2:0).

Table 8. Test Mode Selection Scenario Defined by TSTPT(2:0)(1)

TSTPT(2:0) CAPTURE VALUE NO SWITCHING ACTIVITY CLOCK DEBUG OUTPUT
x000 x010
TSTPT(0) HI-Z 60 MHz
TSTPT(1) HI-Z 30 MHz
TSTPT(2) HI-Z 0.7 to 22.5MHz
TSTPT(3) HI-Z HIGH
TSTPT(4) HI-Z LOW
TSTPT(5) HI-Z HIGH
TSTPT(6) HI-Z HIGH
TSTPT(7) HI-Z 7.5 MHz
These are only the default output selections. Software can reprogram the selection at any time.