ZHCSJ26 November   2018 DLP3310

PRODUCTION DATA.  

  1. 特性
  2. 应用
  3. 说明
    1.     Device Images
      1.      简化应用
  4. 修订历史记录
  5. Pin Configuration and Functions
    1.     Pin Functions – Connector Pins
    2.     Pin Functions – Test Pads
  6. Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  Storage Conditions
    3. 6.3  ESD Ratings
    4. 6.4  Recommended Operating Conditions
    5. 6.5  Thermal Information
    6. 6.6  Electrical Characteristics
    7. 6.7  Timing Requirements
    8. 6.8  Switching Characteristics
    9. 6.9  System Mounting Interface Loads
    10. 6.10 Micromirror Array Physical Characteristics
    11. 6.11 Micromirror Array Optical Characteristics
    12. 6.12 Window Characteristics
    13. 6.13 Chipset Component Usage Specification
    14. 6.14 Software Requirements
  7. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Power Interface
      2. 7.3.2 Low-Speed Interface
      3. 7.3.3 High-Speed Interface
      4. 7.3.4 Timing
    4. 7.4 Device Functional Modes
    5. 7.5 Optical Interface and System Image Quality Considerations
      1. 7.5.1 Numerical Aperture and Stray Light Control
      2. 7.5.2 Pupil Match
      3. 7.5.3 Illumination Overfill
    6. 7.6 Micromirror Array Temperature Calculation
    7. 7.7 Micromirror Landed-On/Landed-Off Duty Cycle
      1. 7.7.1 Definition of Micromirror Landed-On/Landed-Off Duty Cycle
      2. 7.7.2 Landed Duty Cycle and Useful Life of the DMD
      3. 7.7.3 Landed Duty Cycle and Operational DMD Temperature
      4. 7.7.4 Estimating the Long-Term Average Landed Duty Cycle of a Product or Application
  8. Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curve
  9. Power Supply Recommendations
    1. 9.1 Power Supply Power-Up Procedure
    2. 9.2 Power Supply Power-Down Procedure
    3. 9.3 Power Supply Sequencing Requirements
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11器件和文档支持
    1. 11.1 器件支持
      1. 11.1.1 器件命名规则
      2. 11.1.2 器件标记
    2. 11.2 相关链接
    3. 11.3 社区资源
    4. 11.4 商标
    5. 11.5 静电放电警告
    6. 11.6 术语表
  12. 12机械、封装和可订购信息

封装选项

机械数据 (封装 | 引脚)
  • FQM|92
订购信息

Absolute Maximum Ratings

see (1)
MIN MAX UNIT
Supply voltage VDD Supply voltage for LVCMOS core logic(2)
Supply voltage for LPSDR low speed interface
–0.5 2.3 V
VDDI Supply voltage for SubLVDS receivers(2) –0.5 2.3 V
VOFFSET Supply voltage for HVCMOS and micromirror electrode(2)(3) –0.5 11 V
VBIAS Supply voltage for micromirror electrode(2) –0.5 19 V
VRESET Supply voltage for micromirror electrode(2) –15 0.5 V
|VDDI–VDD| Supply voltage delta (absolute value)(4) 0.3 V
|VBIAS–VOFFSET| Supply voltage delta (absolute value)(5) 11 V
|VBIAS–VRESET| Supply voltage delta (absolute value)(6) 34 V
Input voltage Input voltage for other inputs LPSDR(2) –0.5 VDD + 0.5 V
Input voltage for other inputs SubLVDS(2)(7) –0.5 VDDI + 0.5 V
Input pins |VID| SubLVDS input differential voltage (absolute value)(7) 810 mV
IID SubLVDS input differential current 10 mA
Clock frequency ƒclock Clock frequency for low speed interface LS_CLK 130 MHz
ƒclock Clock frequency for high speed interface DCLK 620 MHz
Environmental TARRAY and TWINDOW Temperature – operational (8) –20 90 °C
Temperature – non-operational(8) –40 90 °C
|TDELTA| Absolute temperature delta between any point on the window edge and the ceramic test point TP1(9) 30 °C
TDP Dew Point - operating and non-operating 81 °C
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device is not implied at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure above or below the Recommended Operating Conditions for extended periods may affect device reliability.
All voltage values are with respect to the ground terminals (VSS). The following power supplies are all required to operate the DMD: VDD, VDDI, VOFFSET, VBIAS, and VRESET. All VSS connections are also required.
VOFFSET supply transients must fall within specified voltages.
Exceeding the recommended allowable absolute voltage difference between VDDI and VDD may result in excessive current draw.
Exceeding the recommended allowable absolute voltage difference between VBIAS and VOFFSET may result in excessive current draw.
Exceeding the recommended allowable absolute voltage difference between VBIAS and VRESET may result in excessive current draw.
This maximum input voltage rating applies when each input of a differential pair is at the same voltage potential. Sub-LVDS differential inputs must not exceed the specified limit or damage may result to the internal termination resistors.
The highest temperature of the active array (as calculated by the Micromirror Array Temperature Calculation) or of any point along the window edge as defined in Figure 18. The locations of thermal test points TP2, TP3, TP4, and TP5 in Figure 18 are intended to measure the highest window edge temperature. If a particular application causes another point on the window edge to be at a higher temperature, that point should be used.
Temperature delta is the highest difference between the ceramic test point 1 (TP1) and anywhere on the window edge as shown in Figure 18. The window test points TP2, TP3, TP4, and TP5 shown in Figure 18 are intended to result in the worst case delta. If a particular application causes another point on the window edge to result in a larger delta temperature, that point should be used.