SPRS550F October   2009  – July 2014 AM3505 , AM3517

PRODUCTION DATA.  

  1. 1Device Summary
    1. 1.1 Features
    2. 1.2 Applications
    3. 1.3 Description
    4. 1.4 Functional Block Diagram
  2. 2Revision History
  3. 3Device Comparison
    1. 3.1 Device Features Comparison
    2. 3.2 ZCN and ZER Package Differences
  4. 4Terminal Configuration and Functions
    1. 4.1 Pin Assignments
      1. 4.1.1 Pin Map (Top View)
    2. 4.2 Ball Characteristics
    3. 4.3 Multiplexing Characteristics
    4. 4.4 Signal Description
      1. 4.4.1 External Memory Interfaces
      2. 4.4.2 Video Interfaces
      3. 4.4.3 Serial Communication Interfaces
      4. 4.4.4 Removable Media Interfaces
      5. 4.4.5 Test Interfaces
      6. 4.4.6 Miscellaneous
      7. 4.4.7 General-Purpose IOs
      8. 4.4.8 System and Miscellaneous Terminals
      9. 4.4.9 Power Supplies
  5. 5Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  Handling Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Power Consumption Summary
    5. 5.5  Electrical Characteristics
    6. 5.6  Thermal Characteristics
    7. 5.7  Core Voltage Decoupling
    8. 5.8  Power-up and Power-down
      1. 5.8.1 Power-up Sequence
      2. 5.8.2 Power-down Sequence
    9. 5.9  Clock Specifications
      1. 5.9.1 Oscillator
      2. 5.9.2 Input Clock Specifications
      3. 5.9.3 Output Clock Specifications
      4. 5.9.4 DPLL Specifications
        1. 5.9.4.1 Digital Phase-Locked Loop (DPLL)
          1. 5.9.4.1.1 DPLL1 (MPU)
          2. 5.9.4.1.2 DPLL3 (CORE)
          3. 5.9.4.1.3 DPLL4 (Peripherals)
          4. 5.9.4.1.4 DPLL5 (Second peripherals DPLL)
        2. 5.9.4.2 DPLL Noise Isolation
    10. 5.10 Video DAC Specifications
      1. 5.10.1 Interface Description
      2. 5.10.2 Electrical Specifications Over Recommended Operating Conditions
      3. 5.10.3 Analog Supply (vdda_dac) Noise Requirements
      4. 5.10.4 External Component Value Choice
  6. 6Timing Requirements and Switching Characteristics
    1. 6.1 Timing Test Conditions
    2. 6.2 Interface Clock Specifications
      1. 6.2.1 Interface Clock Terminology
      2. 6.2.2 Interface Clock Frequency
      3. 6.2.3 Clock Jitter Specifications
      4. 6.2.4 Clock Duty Cycle Error
    3. 6.3 Timing Parameters
    4. 6.4 External Memory Interfaces
      1. 6.4.1 General-Purpose Memory Controller (GPMC)
        1. 6.4.1.1 GPMC/NOR Flash Interface Synchronous Timing
        2. 6.4.1.2 GPMC/NOR Flash Interface Asynchronous Timing
        3. 6.4.1.3 GPMC/NAND Flash Interface Timing
      2. 6.4.2 SDRAM Controller (SDRC)
        1. 6.4.2.1 LPDDR Interface
          1. 6.4.2.1.1 LPDDR Interface Schematic
          2. 6.4.2.1.2 Compatible JEDEC LPDDR Devices
          3. 6.4.2.1.3 PCB Stackup
          4. 6.4.2.1.4 Placement
          5. 6.4.2.1.5 LPDDR Keep Out Region
          6. 6.4.2.1.6 Net Classes
          7. 6.4.2.1.7 LPDDR Signal Termination
          8. 6.4.2.1.8 LPDDR CK and ADDR_CTRL Routing
        2. 6.4.2.2 DDR2 Interface
          1. 6.4.2.2.1  DDR2 Interface Schematic
          2. 6.4.2.2.2  Compatible JEDEC DDR2 Devices
          3. 6.4.2.2.3  PCB Stackup
          4. 6.4.2.2.4  Placement
          5. 6.4.2.2.5  DDR2 Keep Out Region
          6. 6.4.2.2.6  Bulk Bypass Capacitors
          7. 6.4.2.2.7  High-Speed Bypass Capacitors
          8. 6.4.2.2.8  Net Classes
          9. 6.4.2.2.9  DDR2 Signal Termination
          10. 6.4.2.2.10 VREF Routing
          11. 6.4.2.2.11 DDR2 CLK and ADDR_CTRL Routing
          12. 6.4.2.2.12 On Die Termination (ODT)
    5. 6.5 Video Interfaces
      1. 6.5.1 Video Processing Subsystem (VPSS)
        1. 6.5.1.1 Video Processing Front End (VPFE)
          1. 6.5.1.1.1 Video Processing Front End (VPFE) Timing
      2. 6.5.2 Display Subsystem (DSS)
        1. 6.5.2.1 LCD Display Support in Bypass Mode
          1. 6.5.2.1.1 LCD Display in TFT Mode
          2. 6.5.2.1.2 LCD Display in STN Mode
    6. 6.6 Serial Communications Interfaces
      1. 6.6.1  Multichannel Buffered Serial Port (McBSP) Timing
        1. 6.6.1.1 McBSP in Normal Mode
          1. 6.6.1.1.1 McBSP1
          2. 6.6.1.1.2 McBSP2
          3. 6.6.1.1.3 McBSP3
            1. 6.6.1.1.3.1 McBSP3 Multiplexed on McBSP3 Pins
            2. 6.6.1.1.3.2 McBSP3 Multiplexed on UART2 or McBSP1 Pins
          4. 6.6.1.1.4 McBSP4
          5. 6.6.1.1.5 McBSP5
          6. 6.6.1.1.6 McBSP in TDM Mode
          7. 6.6.1.1.7 McBSP Timing Diagrams
      2. 6.6.2  Multichannel Serial Port Interface (McSPI) Timing
        1. 6.6.2.1 McSPI in Slave Mode
        2. 6.6.2.2 McSPI in Master Mode
      3. 6.6.3  Multiport Full-Speed Universal Serial Bus (USB) Interface
        1. 6.6.3.1 Multiport Full-Speed Universal Serial Bus (USB) - Unidirectional Standard 6-pin Mode
        2. 6.6.3.2 Multiport Full-Speed Universal Serial Bus (USB) - Bidirectional Standard 4-pin Mode
        3. 6.6.3.3 Multiport Full-Speed Universal Serial Bus (USB) - Bidirectional Standard 3-pin Mode
      4. 6.6.4  Multiport High-Speed Universal Serial Bus (USB) Timing
        1. 6.6.4.1 High-Speed Universal Serial Bus (USB) on Ports 1 and 2 12-bit Master Mode
      5. 6.6.5  USB0 OTG (USB2.0 OTG)
        1. 6.6.5.1 USB OTG Electrical Parameters
      6. 6.6.6  High-End Controller Area Network Controller (HECC) Timing
        1. 6.6.6.1 HECC Timing Requirements
        2. 6.6.6.2 HECC Switching Characteristics
      7. 6.6.7  Ethernet Media Access Controller (EMAC)
        1. 6.6.7.1 EMAC Electrical Data/ Timing
      8. 6.6.8  Management Data Input/Output (MDIO)
        1. 6.6.8.1 Management Data Input/Output (MDIO) Electrical Data/Timing
      9. 6.6.9  Universal Asynchronous Receiver/Transmitter (UART)
        1. 6.6.9.1 UART IrDA Interface
          1. 6.6.9.1.1 IrDA—Receive Mode
          2. 6.6.9.1.2 IrDA—Transmit Mode
      10. 6.6.10 HDQ / 1-Wire Interfaces
        1. 6.6.10.1 HDQ Protocol
        2. 6.6.10.2 1-Wire Protocol
      11. 6.6.11 I2C Interface
        1. 6.6.11.1 I2C Standard/Fast-Speed Mode
        2. 6.6.11.2 I2C High-Speed Mode
    7. 6.7 Removable Media Interfaces
      1. 6.7.1 High-Speed Multimedia Memory Card (MMC) and Secure Digital IO Card (SDIO) Timing
        1. 6.7.1.1 MMC/SD/SDIO in SD Identification Mode
        2. 6.7.1.2 MMC/SD/SDIO in High-Speed MMC Mode
        3. 6.7.1.3 MMC/SD/SDIO in Standard MMC Mode and MMC Identification Mode
        4. 6.7.1.4 MMC/SD/SDIO in High-Speed SD Mode
        5. 6.7.1.5 MMC/SD/SDIO in Standard SD Mode
    8. 6.8 Test Interfaces
      1. 6.8.1 Embedded Trace Macro Interface (ETM)
      2. 6.8.2 JTAG Interfaces
        1. 6.8.2.1 JTAG Free Running Clock Mode
        2. 6.8.2.2 JTAG Adaptive Clock Mode
  7. 7Device and Documentation Support
    1. 7.1 Device Support
      1. 7.1.1 Development Support
        1. 7.1.1.1 Getting Started and Next Steps
      2. 7.1.2 Device Nomenclature
    2. 7.2 Documentation Support
      1. 7.2.1 Related Documentation
    3. 7.3 Related Links
    4. 7.4 Community Resources
    5. 7.5 Trademarks
    6. 7.6 Electrostatic Discharge Caution
  8. 8Mechanical Packaging and Orderable Information
    1. 8.1 Package Option Addendum

封装选项

请参考 PDF 数据表获取器件具体的封装图。

机械数据 (封装 | 引脚)
  • ZER|484
  • ZCN|491
散热焊盘机械数据 (封装 | 引脚)
订购信息

5 Specifications

5.1 Absolute Maximum Ratings

Table 5-1 specifies the absolute maximum ratings over the operating junction temperature range of commercial and extended temperature devices. Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

Notes:

  • Logic functions and parameter values are not assured out of the range specified in the recommended operating conditions.

Table 5-1 Absolute Maximum Ratings Over Operating Junction Temperature Range

PARAMETER MIN MAX UNIT
VDD_CORE Supply voltage range for core macros -0.5 1.6 V
VDDS Second supply voltage range for 1.8-V I/O macros -0.5 2.25 V
VDDSHV Supply voltage range for 1.8/3.3V I/O macros -0.5 3.8 V
VDDS_SRAM_MPU Analog Supply voltage range for 1.8-V MPU SLDO -0.5 2.25 V
VDDS_SRAM_CORE_BG Analog Supply voltage range for 1.8-V Core SLDO and VDDA of BandGap -0.5 2.25 V
VDDS_DPLL_MPU_USBHOST Analog power supply for 1.8-V MPUSS DPLL and USBHOST DPLL -0.5 2.1 V
VDDS_DPLL_PER_CORE Analog power supply for 1.8-V DPLL and HSDIVIDER/ CORE and HSDIVIDER -0.5 2.1 V
VDDA_DAC Analog Power Supply for 1.8-V DAC -0.5 2.43 V
VDDA3P3V_USBPHY Analog power supply for 3.3-V USB transceiver -0.5 3.6 V
VDDA1P8V_USBPHY Power Supply for 1.8-V USB transceiver -0.5 2.0 V
VDDSOSC Power Supply for 1.8-V oscillator -0.5 2.1 V
VPAD Voltage range at PAD Oscillator input (sys_xtalin) -0.3 VDDSOSC + 0.3 V
VDDS 1.8-V I/O macros -0.3 VDDS + 0.3
Dual-voltage LVCMOS inputs, VDDSHV = 1.8 V -0.3 VDDSHV + 0.3
Dual-voltage LVCMOS inputs, VDDSHV = 3.3 V -0.3 3.8
USB VBUS pin (usb0_vbus) 5.5
USB 5V Tolerant IOs (usb0_dp, usb0_dm, usb0_id) 5.25
IIOI Current-pulse injection on each I/O pin(1) 200 mA
Iclamp Clamp current for an input or output -20 20 mA
(1) Each device is tested with I/O pin injection of 200 mA with a stress voltage of 1.5 times maximum vdd at room temperature.

5.2 Handling Ratings

Table 5-2 Handling Ratings

PARAMETER MIN MAX UNIT
VESD ESD stress voltage(1) HBM (human body model)(2) >1000 V
CDM (charged device model)(3) >500
Tstg Storage temperature range -65 150 °C
(1) Electrostatic discharge (ESD) to measure device sensitivity/immunity to damage caused by electrostatic discharges into the device.
(2) The level listed above is the passing level per ANSI/ESDA/JEDEC JS-001-2010. JEDEC document JEP155 states that 500V HBM allows safe manufacturing with a standard ESD control process, and manufacturing with less than 500V HBM is possible if necessary precautions are taken. Actual performance of the device may exceed the value listed above.
(3) The level listed above is the passing level per EIA-JEDEC JESD22-C101E. JEDEC document JEP157 states that 250V CDM allows safe manufacturing with a standard ESD control process. Actual performance of the device may exceed the value listed above.

5.3 Recommended Operating Conditions

All AM3517/05 modules are used under the operating conditions contained in Table 5-3.

Note: Logic functions and parameter values are not assured if the device is operated out of the range specified in the recommended operating conditions.

Table 5-3 Recommended Operating Conditions

PARAMETER DESCRIPTION MIN NOM MAX UNIT
VDD_CORE Core and oscillator macros power supply 1.152 1.20 1.248 V
Noise (peak-peak) 24.00 mVpp
VDDS_SRAM_MPU MPU SRAM LDO analog power supply 1.71 1.80 1.89 V
Noise (peak-peak) 50.00 mVpp
VDDS_SRAM_CORE_BG Core SRAM LDO and BandGap analog power supply 1.71 1.80 1.89 V
Noise (peak-peak) 50.00 mVpp
VDDS_DPLL_MPU_
USBHOST
MPU and USBHOST DPLL analog power supply 1.71 1.80 1.89 V
Noise (peak-peak) 35.00 mVpp
VDDS_DPLL_
PER_CORE
Peripherals and Core DPLLs analog power supply 1.71 1.80 1.89 V
Noise (peak-peak) 35.00 mVpp
VDDA_DAC DAC analog power supply 1.71 1.80 1.89 V
Noise (peak-peak) 30.00 mVpp
VSSA_DAC DAC analog ground 0.00 V
VDDA3P3V_
USBPHY
Analog power supply for 3.3-V USB transceiver 3.14 3.30 3.47 V
Noise (peak-peak) 70.00 mVpp
VDDA1P8V_
USBPHY
Power Supply for 1.8-V USB transceiver 1.71 1.80 1.89 V
Noise (peak-peak) 50.00 mVpp
VDDSHV 3.3-/1.8-V power supply 1.8 V Mode 1.71 1.80 1.89 V
3.3 V Mode 3.14 3.30 3.47 V
VDDS 1.8-V power supply 1.71 1.80 1.89 V
Tj Operating junction temperature range Commercial
Temperature
0 90 °C
Extended
Temperature
-40 105 °C
Device Operating Life Power-On Hours (POH)(1) 500 MHz ARM Clock Freq. < 90°C TJ 100K hrs.
90 - 105 °C TJ 100K
600 MHz ARM Clock Freq. < 90°C TJ 100K
90 - 105 °C TJ 50K(2)
(1) The POH information is provided solely for your convenience and does not extend or modify the warranty provided under TI’s standard terms and conditions for TI semiconductor products.
(2) Maximum lifetime will be 100k Power On Hours as long as no more than 50k is greater than 90°C.

Figure 5-1 shows the power domains:

swps030-003updated3.gifFigure 5-1 AM3517/05 Voltage Domains

5.4 Power Consumption Summary

The supply voltages and power consumption estimates are detailed in Table 5-4.

Table 5-4 Estimated Power Consumption at Ball Level

SIGNAL NAME DESCRIPTION MAX CURRENT (mA)
VDD_CORE 1.2-V core and oscillator macros power supply AM3517 1500 mA
AM3505 1400 mA
VDDS_SRAM_MPU 1.8-V MPU SLDO analog power supply 40 mA
VDDS_SRAM_CORE_BG 1.8-V Core SLDO and VDDA of BandGap analog power supply 40 mA
VDDS_DPLL_MPU_USBHOST 1.8-V MPUSS DPLL and USBHOST DPLL analog power supply 25 mA
VDDS_DPLL_PER_CORE 1.8-V DPLL and HSDIVIDER/ CORE and HSDIVIDER analog power supply 25 mA
VDDA_DAC 1.8-V DAC analog power supply 65 mA
VDDA3P3V_USBPHY 3.3-V USB transceiver analog power supply 10 mA
VDDA1P8V_USBPHY 1.8-V USB transceiver power supply 50 mA
VDDSHV 3.3-/1.8-V power supply 300 mA
VDDS 1.8-V power supply 200 mA
VDDSOSC 1.8-V oscillator power supply 20 mA

5.5 Electrical Characteristics

Table 5-5 summarizes the DC electrical characteristics.

Table 5-5 DC Electrical Characteristics

PARAMETER MIN NOM MAX UNIT
LVCMOS Pin Buffers
VIH High-level input voltage VDDSHV = 1.8 V(1) 0.65 x VDDSHV. V
VDDSHV = 3.3 V(1) 2
sys_xtalin 0.8 x VDDSOSC
VIL Low-level input voltage VDDSHV = 1.8 V(1) 0.35 x VDDSHV V
VDDSHV = 3.3 V(1) 0.8
sys_xtalin 0.2 x VDDSOSC
VOH High-level output voltage VDDSHV = 1.8 V(1)
IOH = -2 mA
VDDSHV - 0.45 V
VDDSHV = 3.3 V(1)
IOH = -2 mA
2.4
VOL Low-level output voltage VDDSHV = 1.8 V(1)
IOL = 2 mA
0.45 V
VDDSHV = 3.3 V(1)
IOL = 2 mA
0.4
II Input current for dual voltage IO pins VI = Vss to VDDSHV Input pins with pull disabled -9 9 µA
VI = Vss to VDDSHV Input pins with 100 µA pull-up enabled -310 -70
VI = Vss to VDDSHV Input pins with 100 µA pull-down enabled 75 270
Input current for DDR2/mDDR 1.8V IO pins VI = Vss to VDDSHV Input pins with 100 µA pull-down enabled 77 286
IOZ Off-state output current VO = VDDSHV or 0V Pull disabled -20 20 µA
IOH High-level output current (dual-voltage LVCMOS IOs) -2 mA
IOL Low-level output current (dual-voltage LVCMOS IOs) 2 mA
tT Input transition time (rise time, tR or fall time, tF evaluated between 10% and 90% at PAD) VDDSHV = 1.8 V(1) Normal mode 10 ns
High-speed mode 3
VDDSHV = 3.3 V(1) Normal mode 10
High-speed mode 3
Capacitance Input capacitance
(dual-voltage LVCMOS I/Os)
3 pF
Output capacitance
(dual-voltage LVCMOS I/Os)
3 pF
Complex IO Dedicated to USB : USB0_DM and USB0_DP
VIH High-level input voltage Low/Full speed 2.0 V
High speed (2)
VIL Low-level input voltage Low/Full speed 0.8 V
High speed (2)
VOH High-level output voltage Low/Full speed 2.8 VDDA3P3V_
USBPHY
V
High speed 360 440 mV
VOL Low-level output voltage Low/Full speed 0.0 0.3 V
High speed -10 10 mV
(1) These IO specifications apply to the dual-voltage IOs only and do not apply to the DDR2/mDDR interfaces. DDR2/mDDR IOs are 1.8V IOs and adhere to the JESD79-2A standard.
(2) These parameters must adhere to the requirements defined in section 7.1.7.2 of Universal Serial Bus Specifications revision 2.0.

5.6 Thermal Characteristics

Table 5-6 and Table 5-7 provide the thermal resistance characteristics for the recommended package types used on the AM3517/05.

Table 5-6 Package Thermal Resistance Characteristics [ZCN Package]

NAME DESCRIPTION AIR FLOW (m/s)(1) ZCN (°C/W)(2)
ΘJC Junction-to-case (1S0P)(3) NA 2.6
ΘJB Junction-to-board (2S2P)(3) NA 10.1
ΘJA Junction-to-free air (2S2P)(3) 0.0 24.1
1.0 18.7
2.0 17.5
3.0 16.8
ΨJT Junction-to-package top (2S2P)(3) 0.0 0.05
1.0 0.2
2.0 0.2
3.0 0.3
ΨJB Junction-to-board (2S2P)(3) 0.0 10.0
1.0 10.3
2.0 10.2
3.0 10.1
(1) m/s = meters per second.
(2) °C/W = degrees celsius per watt.
(3) The board types are defined by JEDEC (reference JEDEC standard JESD51-9, Test Board for Area Array Surface Mount Package Thermal Measurements).

Table 5-7 Package Thermal Resistance Characteristics [ZER](4)

NAME DESCRIPTION AIR FLOW (m/s)(1) ZER (°C/W)(2)
ΘJC Junction-to-case (2S2P)(3) NA 6
ΘJB Junction-to-board (2S2P)(3) NA 6
ΘJA Junction-to-free air (2S2P)(3) 0.0 15.8
1.0 12.0
2.0 11.1
3.0 10.8
ΨJT Junction-to-package top (2S2P)(3) 0.0 3.3
1.0 3.7
2.0 3.5
3.0 3.5
ΨJB Junction-to-board (2S2P)(3) 0.0 6.0
1.0 6.1
2.0 5.8
3.0 5.7
(1) m/s = meters per second.
(2) °C/W = degrees celsius per watt.
(3) The board types are defined by JEDEC (reference JEDEC standard JESD51-9, Test Board for Area Array Surface Mount Package Thermal Measurements).
(4) Package thermal resistance characteristics for ZER support only 2S2P.

5.7 Core Voltage Decoupling

For module performance, decoupling capacitors are required to suppress the switching noise generated by high frequency and to stabilize the supply voltage. A decoupling capacitor is most effective when it is close to the device because this minimizes the inductance of the circuit board wiring and interconnects.

Table 5-8 summarizes the power supplies decoupling characteristics.

Table 5-8 Core Voltage Decoupling Characteristics

PARAMETER MIN TYP MAX UNIT
Cvdd_core(1) 50 100 120 nF
Ccap_vdd_sram_core 100 nF
Cvdds_dpll_mpu_usbhost 100 nF
Cvdds_dpll_per_core 100 nF
Cvdda_dac 100 nF
Cvdd_sram_core 100 nF
Cvdd_sram_core_bg 100 nF
Cvdds_sram_mpu 100 nF
Cvddshv 100 nF
Cvdda3p3v_usbphy 100 nF
Cvdda1p8v_usbphy 100 nF
(1) 1 capacitor per 2 to 4 balls

Figure 5-2 shows an example of power supply decoupling.

swps030-004updated2.gif
1. Decoupling capacitors must be placed as closed as possible to the power ball. Choose the ground located closest to the power pin for each decoupling capacitor. Place the decoupling capacitor Ci in a group of 1, 2, or 3 balls; the total must be equal to the decoupling requirement. In case you interconnect powers, first insert the decoupling capacitor and then interconnect the powers.
2. The decoupling capacitor value depends on the board characteristics.
Figure 5-2 Power Supply Decoupling

5.8 Power-up and Power-down

This section provides the timing requirements for the AM3517/05 hardware signals.

5.8.1 Power-up Sequence

The following steps give an example of power-up sequence supported by the AM3517/05.

  1. IO 1.8V supply (VDDS), Band-gap and LDO supplies (VDDS_SRAM_CORE_BG, VDDS_SRAM_MPU) and oscillator supply (VDDSOSC) should come up first to a stable state.
  2. IO 3.3V (VDDSHV) supply should be ramped up next to a stable state.
  3. Core (VDD_CORE) supply follows next to a stable state.
  4. All the PLL supplies (VDDS_DPLL_PER_CORE, VDDS_DPLL_MPU_USBHOST) and 1.8 V complex IO supplies (VDDA_DAC, VDDA1P8V_USBPHY) should be ramped up next to a stable state.
  5. Finally, 3.3 V complex IO (VDDA_3P3V_USBPHY) should be ramped up.
  6. sys_nrespwron must be held low at the time the power supplies are ramped up till the time the sys_32k and sys_xtalin clocks are stable.

Note: In VDDSHV 1.8 V operation mode, VDDSHV can be grouped and powered up together with VDDS, VDDS_SRAM_CORE_BG, VDDS_SRAM_MPU and VDDSOSC.

Figure 5-3 shows the power-up sequence.

finalpowerupseq.gifFigure 5-3 Power-up Sequence

5.8.2 Power-down Sequence

The AM3517/05 device proceeds with the power-down sequence shown below.

The following steps give an example of the power-down sequence supported by the AM3517/05 device.

  1. Reset AM3517/05 device.
  2. Stop all signals driven to AM3517/05.
  3. Option 1: Power down all domains simutaneously.
  4. Option 2: If all domains cannot be powered down simultaneously, follow the below sequence:
    1. Power off all complex I/O domains
    2. Power off core domain (VDD_CORE)
    3. Power off all PLL domains (VDDS_DPLL_MPU_USBHOST and VDDS_DPLL_PER_CORE)
    4. Power off all SRAM LDOs
    5. Power off all standard I/O domains (VDDS and VDDSHV)

5.9 Clock Specifications

The AM3517/05 device has three external input clocks, a low frequency (sys_32k), a high frequency (sys_xtalin), and an optional (sys_altclk). The AM3517/05 device has two configurable output clocks, sys_clkout1 and sys_clkout2.

Figure 5-4 shows the interface to the external clock sources and clock outputs.

swps030-007updated1.gifFigure 5-4 Clock Interface

The AM3517/05 device operation requires the following three input clocks:

  • The 32-kHz clock can be generated using one of the following options and can be selected via the sys_boot7 pin. See Figure 5-5.
    • External: Supplied by an oscillator on the sys_32k pin.
    • Internal: 32-kHz clock generation using a fixed divider on the HS system clock (26MHz).
  • The system alternative clock can be used (through the sys_altclk pin) to provide alternative 48 or 54 MHz or other clock source (up to 54 MHz).
  • The system clock input (26 MHz) is used to generate the main source clock of the AM3517/05 device. It supplies the DPLLs as well as several AM3517/05 modules. The system clock input can be connected to either:
    • A crystal oscillator clock managed by sys_xtalin and sys_xtalout. In this case, the sys_clkreq is used as an input (GPIN).
    • A CMOS digital clock through the sys_xtalin pin. In this case, the sys_clkreq is used as an output to request the external system clock.
clock_int_prs550.gifFigure 5-5 32-kHz Clock Generation

The AM3517/05 outputs externally two clocks:

  • sys_clkout1 can output the oscillator clock (26 MHz) at any time.
  • sys_clkout2 can output the oscillator clock, core_clk, 96 MHz or 54 MHz. It can be divided by 2, 4, 8, or 16 and its off state polarity is programmable.

5.9.1 Oscillator

The sys_xtalin (26 MHz) oscillator provides the primary reference clock for the device. The on-chip oscillator requires an external crystal connected across the sys_xtalin and sys_xtalout pins, along with two load capacitors, as shown in Figure 4-3. The external crystal load capacitors must be connected only to the oscillator ground pin (VSSOSC). Do not connect to board ground (VSS).

Note: If an external oscillator is to be used, the external oscillator clock signal should be connected to the sys_xtalin pin with a 1.8V amplitude. The sys_xtalout should be left unconnected and the VSSOSC signal should be connected to board ground (VSS).

dg_rtcosc_prs550.gif
A. Oscillator components (Crystal, C1, C2) must be located close to the AM35x package. Parasitic capacitance to the printed circuit board (PCB) ground and other signals should be minimized to reduce noise coupled into the oscillator. The VSSOSC terminal provides a Kelvin ground reference for the external crystal components. External crystal component grounds should only be connected to the VSSOSC terminal and should not be connected to the PCB ground plane.
B. C1 and C2 represent the total capacitance of the respective PCB trace, load capacitor, and other components (excluding the crystal) connected to each crystal terminal. The value of capacitors C1 and C2 should be selected to provide the total load capacitance, CL, specified by the crystal manufacturer. The total load capacitance is CL = [(C1*C2)/(C1+C2)] + Cshunt, where Cshunt is the crystal shunt capacitance (C0) specified by the crystal manufacturer plus any mutual capacitance (Cpkg + CPCB) seen across the AM3517/05 sys_xtalin and sys_xtalout signals. For recommended values of crystal circuit components, see Table 5-9.
AM3517/05 Oscillator Connections

Table 5-9 Crystal Electrical Characteristics

PARAMETER MIN TYP MAX UNIT
Oscillation frequency 26 MHz
Crystal ESR 50 Ω
Frequency stability +/- 50 ppm
Parallel Load Capacitance (C1 and C2) 20 pF
Shunt Capacitance 5 pF

5.9.2 Input Clock Specifications

The clock system accepts three input clock sources:

  • 32-kHz digital CMOS clock
  • Crystal oscillator clock or CMOS digital clock (26 MHz)
  • Alternate clock (48 or 54 MHz, or other up to 54 MHz)

Table 5-10 26-MHz SYS_CLK Input Clock Timing Requirements

PARAMETER DESCRIPTION MIN TYP MAX UNIT
f(xtalin) Frequency, sys_xtalin 26 MHz
tw(xtalin) Duty Cycle, sys_xtalin 45 55 %
tj(xtalin) Jitter, sys_xtalin -1 1 %
tt(xtalin) Transition time, sys_xtalin 5 ns

Table 5-11 and Table 5-12 detail the electrical characteristics and input requirements of the 32-kHz input clock.

Table 5-11 32-kHz Input Clock Source Electrical Characteristics

PARAMETER DESCRIPTION MIN TYP MAX UNIT
f Frequency, sys_32k 32.768 kHz
Ci Input capacitance 0.45 pF
Ri Input resistance 0.25 106

Table 5-12 32-kHz Input Clock Source Timing Requirements(1)

PARAMETER DESCRIPTION MIN TYP MAX UNIT
1 / tc(32k) Frequency, sys_32k 32 kHz
tR(32k) Rise transition time, sys_32k 20 ns
tF(32k) Fall transition time, sys_32k 20 ns
tJ(32k) Frequency stability, sys_32k +/-200 ppm
(1) See Electrical Characteristics for Standard LVCMOS IOs part for sys_32k VIH/VIL parameters.

Table 5-13 and Table 5-14 detail the electrical characteristics and input requirements of the 48- or 54-MHz input clock.

Table 5-13 48-MHz, 54-MHz, or up to 59-MHz Input Clock Source Electrical Characteristics

NAME DESCRIPTION MIN MAX UNIT
f Frequency , sys_altclk 48, 54, or up to 59 MHz
Ci Input capacitance 0.74 pF
Ri Input resistance 0.25 106

Table 5-14 48-MHz, 54-MHz, or up to 59-MHz Input Clock Source Timing Requirements(1)(2)

PARAMETER DESCRIPTION MIN MAX UNIT
1 / tc(sys_altclk) Frequency, sys_altclk 48, 54, or up to 59 MHz
tw(sys_altclk) Duty cycle 45 60 %
tj(sys_altclk) Jitter -1 1 %
tr(sys_altclk) Rise transition time 10 ns
tf(sys_altclk) Fall transition time 10 ns
ft(sys_altclk) Frequency tolerance -50 50 ppm
(1) Peak-to-peak jitter is defined as the difference between the maximum and the minimum output periods on a statistical population of 300 period samples. The sinusoidal noise is added on top of the vdds supply voltage.
(2) See Section 5, Electrical Characteristics, for sys_altclk VIH/VIL parameters.

5.9.3 Output Clock Specifications

Two output clocks (pin sys_clkout1 and pin sys_clkout2) are available:

  • sys_clkout1 can output the oscillator clock (26 MHz) at any time. It can be controlled by software or externally using sys_clkreq control. When the device is in the off state, the sys_clkreq can be asserted to enable the oscillator and activate the sys_clkout1 without waking up the device. The off state polarity of sys_clkout1 is programmable.
  • sys_clkout2 can output sys_clk (26 MHz), core_clk (core DPLL output), APLL-96 MHz, or APLL-54 MHz. It can be divided by 2, 4, 8, or 16 and its off state polarity is programmable. This output is active only when the core domain is active.

Table 5-15 summarizes the sys_clkout1 output clock electrical characteristics.

Table 5-15 SYS_CLKOUT1 Output Clock Electrical Characteristics

NAME DESCRIPTION MIN TYP MAX UNIT
f Frequency 26  MHz
CI Load capacitance(1) f(max) = 38.4 MHz 70 pF
f(max) = 26 MHz 125
(1) The load capacitance is adapted to a frequency.

Table 5-16 details the sys_clkout1 output clock timing characteristics.

Table 5-16 SYS_CLKOUT1 Output Clock Switching Characteristics

NAME DESCRIPTION MIN TYP MAX UNIT
f 1 / CO0 Frequency 26 MHz
CO1 tw(CLKOUT1) Pulse duration, sys_clkout1 low or high 0.40 *
tc(CLKOUT1)
0.60 *
tc(CLKOUT1)
ns
CO2 tR(CLKOUT1) Rise time, sys_clkout1(1) 3.31 ns
CO3 tF(CLKOUT1) Fall time, sys_clkout1(1) 3.31 ns
(1) With a load capacitance of 25 pF.
SWPS030-014.gifFigure 5-6 SYS_CLKOUT1 System Output Clock

Table 5-17 summarizes the sys_clkout2 output clock electrical characteristics.

Table 5-17 SYS_CLKOUT2 Output Clock Electrical Characteristics

NAME DESCRIPTION MIN TYP MAX UNIT
f Frequency, sys_clkout2(2) 166 MHz
CL Load capacitance(1) f(max) = 166 MHz 2 8 12 pF
(1) The load capacitance is adapted to a frequency.
(2) The maximum frequency supported is core_clk/2 MHz.

Table 5-18 details the sys_clkout2 output clock timing characteristics.

Table 5-18 SYS_CLKOUT2 Output Clock Switching Characteristics

NAME DESCRIPTION MIN TYP MAX UNIT
f 1 / CO0 Frequency 166 MHz
CO1 tw(CLKOUT2) Pulse duration, sys_clkout2 low or high 0.40 * tc(CLKOUT2) 0.60 * tc(CLKOUT2) ns
CO2 tR(CLKOUT2) Rise time, sys_clkout2(1) 3.7 ns
CO3 tF(CLKOUT2) Fall time, sys_clkout2(1) 4.3 ns
(1) With a load capacitance of 25 pF.
SWPS030-015.gifFigure 5-7 SYS_CLKOUT2 System Output Clock

5.9.4 DPLL Specifications

The AM3517/05 integrates four DPLLs. The PRM and CM drive them.

The four main DPLLs are:

  • DPLL1 (MPU)
  • DPLL3 (Core)
  • DPLL4 (Peripherals)
  • DPLL5 (Second Peripherals DPLL)

Figure 5-8 shows the DPLL implementation.

dri_dpll_prs570updated1.gifFigure 5-8 DPLL Implementation

5.9.4.1 Digital Phase-Locked Loop (DPLL)

The DPLL provides all interface clocks and some functional clocks (such as the processor clocks) of the AM3517/05 device.

DPLL1 gets an always-on clock used to produce the synthesized clock. They get a high-speed bypass clock used to switch the DPLL output clock on this high-speed clock during bypass mode.

The high-speed bypass clock is an L3 divided clock (programmable by 1 or 2) that saves DPLL processor power consumption when the processor does not need to run faster than the L3 clock speed, or optimizes performance during frequency scaling.

Each DPLL synthesized frequency is set by programming M (multiplier) and N (divider) factors. In addition, all DPLL outputs can be controlled by an independent divider (M2 to M6).

The clock generating DPLLs of the AM3517/05 device have following features:

  • Independent power domain per DPLL
  • Controlled by clock-manager (CM)
  • Fed with always-on system clock with independent gating control per DPLL
  • Analog part supplied through dedicated power supply (1.8 V) and an embedded LDO to get rid of 1-MHz noise
  • Up to four independent output dividers for simultaneous generation of multiple clock frequencies

5.9.4.1.1 DPLL1 (MPU)

DPLL1 is located in the MPU subsystem and supplies all clocks of the subsystem. All MPU subsystem clocks are internally generated in the subsystem. When the core domain is on, it can use the DPLL3 (CORE DPLL) output as a high-frequency bypass input clock.

5.9.4.1.2 DPLL3 (CORE)

DPLL3 supplies all interface clocks and also a few module functional clocks. It can be also source of the emulation trace clock. It is located in the core domain area. All interface clocks and a few module functional clocks are generated in the CM. When the core domain is on, it can be used as a bypass input to DPLL1.

5.9.4.1.3 DPLL4 (Peripherals)

DPLL4 generates clocks for the peripherals. It supplies five clock sources: 96-MHz functional clocks to subsystems and peripherals, 54 MHz to TV DAC, display functional clock, camera sensor clock, and emulation trace clock. It is located in the core domain area. All interface clocks and few module functional clocks are generated in the CM. Its outputs to the DSS, PER, and EMU domains are propagated with always-on clock trees.

5.9.4.1.4 DPLL5 (Second peripherals DPLL)

DPLL5 supplies the 120-MHz functional clock to the CM.

5.9.4.2 DPLL Noise Isolation

The DPLL requires dedicated power supply pins to isolate the core analog circuit from the switching noise generated by the core logic that can cause jitter on the clock output signal. Guard rings are added to the cell to isolate it from substrate noise injection.

The vdd supplies are the most sensitive to noise; decoupling capacitance is recommended below the supply rails. The maximum input noise level allowed is 30 mVPP for frequencies below 1 MHz.

Figure 5-9 shows an example of a noise filter.

swps030-017updated3.gifFigure 5-9 DPLL Noise Filter

Table 5-19 specifies the noise filter requirements.

Table 5-19 DPLL Noise Filter Requirements

NAME MIN TYP MAX UNIT
Filtering capacitor 100 nF
  1. The capacitors must be inserted between power and ground as close as possible.
  2. This circuit is provided only as an example.
  3. The filter must be located as close as possible to the device.
  4. No filtering required if noise is below 10 mVPP.

5.10 Video DAC Specifications

A dual-display interface equips the AM3517/05 processor. This display subsystem provides the necessary control signals to interface the memory frame buffer directly to the external displays (TV-set). Two (one per channel) 10-bit current steering DACs are inserted between the DSS and the TV set to generate the video analog signal. One of the video DACs also includes TV detection and power-down mode. Figure 5-10 shows the AM3517/05 DAC architecture.

swps030-018updated1.gifFigure 5-10 Video DAC Architecture

The following paragraphs detail the 10-bit DAC interface pinout, static and dynamic specifications, and noise requirements. The operating conditions and absolute maximum ratings are detailed in Table 5-21 and Table 5-23.

5.10.1 Interface Description

Table 5-20 summarizes the external pins of the video DAC.

Table 5-20 External Pins of 10-bit Video DAC

PIN NAME I/O DESCRIPTION
tv_out1 O TV analog output composite DAC1 video output. An external resistor is connected between this node and tv_vfb1. The nominal value of ROUT1 is 1650 . Finally, note that this is the output node that drives the load (75 ).
tv_out2 O TV analog output S-VIDEO DAC2 video output. An external resistor is connected between this node and tv_vfb2. The nominal value of ROUT2 is 1650 . Finally, note that this is the output node that drives the load (75 ).
tv_vref I Reference output voltage from internal bandgap A decoupling capacitor (CBG) needs to be connected for optimum performance.
tv_vfb1 O Amplifier feedback node Amplifier feedback node. An external resistor is connected between this node and tv_out1. The nominal value of ROUT1 is 1650 (1%).
tv_vfb2 O Amplifier feedback node Amplifier feedback node. An external resistor is connected between this node and tv_out2. The nominal value of ROUT2 is 1650 (1%).

5.10.2 Electrical Specifications Over Recommended Operating Conditions

(TMIN to TMAX, vdda_dac = 1.8 V, ROUT1/2 = 1650Ω , RLOAD = 75Ω , unless otherwise noted)

Table 5-21 DAC Static Electrical Specification

PARAMETER CONDITIONS/ASSUMPTIONS MIN TYP MAX UNIT
R Resolution 10 Bits
DC ACCURACY
INL(1) Integral nonlinearity 1 1 LSB
DNL(2) Differential nonlinearity 1 1 LSB
ANALOG OUTPUT
- Full-scale output voltage RLOAD = 75Ω 0,7 0.88 1 V
- Output offset voltage 50 mV
- Output offset voltage drift 20 mV/C
- Gain error 17 19 % FS
RVOUT Output impedance 67.5 75 82.5
REFERENCE
VREF Reference voltage range 0.525 0.55 0.575 V
- Reference noise density 100-kHz reference noise bandwidth 129
RSET Full-scale current adjust resistor 3700 4000 4200
PSRR Reference PSRR(3) (Up to 6 MHz) 40 dB
POWER CONSUMPTION
Ivdda-up Analog Supply Current(4) 2 channels, no load 8 mA
- Analog supply driving a 75- load (RMS) 2 channels 50 mA
Ivdda-up (peak) Peak analog supply current: Lasts less than 1 ns 60 mA
Ivdd-up Digital supply current(5) Measured at fCLK = 54 MHz, fOUT = 2 MHz sine wave, vdd = 1.3 V 2 mA
Ivdd-up (peak) Peak digital supply current(6) Lasts less than 1 ns 2.5 mA
Ivdda-down Analog power at power-down T = 30C, vdda = 1.8 V 1.5 mA
Ivdd-down Digital power at power-down T = 30C, vdd = 1.3 V 1 mA
(1) The INL is measured at the output of the DAC (accessible at an external pin during bypass mode).
(2) The DNL is measured at the output of the DAC (accessible at an external pin during bypass mode).
(3) Assuming a capacitor of 0.1 F at the tv_ref node.
(4) The analog supply current Ivdda is directly proportional to the full-scale output current IFS and is insensitive to fCLK
(5) The digital supply current IVDD is dependent on the digital input waveform, the DAC update rate fCLK, and the digital supply VDD.
(6) The peak digital supply current occurs at full-scale transition for duration less than 1 ns.

(TMIN to TMAX, vdda_dac = 1.8 V, ROUT1/2 = 1650 , RLOAD = 75 , unless otherwise noted)

Table 5-22 Video DAC Dynamic Electrical Specification

PARAMETER CONDITIONS/ASSUMPTIONS MIN TYP MAX UNIT
fCLK(1) Output update rate Equal to input clock frequency 54 MHz
Clock jitter rms clock jitter required in order to assure 10-bit accuracy 40 ps
Attenuation at 5.1 MHz Corner frequency for signal 0.1 0.5 1.5 dB
Attenuation at 54 MHz(1) Image frequency 25 30 33 dB
tST Output settling time Time from the start of the output transition to output within 1 LSB of final value. 85 ns
tRout Output rise time Measured from 10% to 90% of full-scale transition 25 ns
tFout Output fall time Measured from 10% to 90% of full-scale transition 25 ns
BW Signal bandwidth 6 MHz
Differential gain(2) 1.5%
Differential phase(2) 1 deg.
SFDR Within bandwidth fCLK = 54 MHz, fOUT = 1 MHz 45 dB
SNR Signal-to-noise ratio
1 kHz to 6 MHz bandwidth
fCLK = 54 MHz, fOUT = 1 MHz 55(3) dB
PSRR Power supply rejection ratio Up to 6 MHz 20(4) dB
Crosstalk Between the two video channels 50 40 dB
(1) For internal input clock information, For more information, see the Device Display Interface Subsystem Reference Guide [SPRUFV2].
(2) The differential gain and phase value is for dc coupling. Note that there is degradation for the ac coupling.
(3) The SNR value is for dc coupling. Note that there is a 6-dB degradation for ac coupling.
(4) The PSSR value is for dc coupling. Note that there is a 10-dB degradation for ac coupling.

5.10.3 Analog Supply (vdda_dac) Noise Requirements

In order to assure 10-bit accuracy of the DAC analog output, the analog supply vdda_dac has to meet the noise requirements stated in this section.

The DAC Power Supply Rejection Ratio is defined as the relative variation of the full-scale output current divided by the supply variation. Thus, it is expressed in percentage of Full-Scale Range (FSR) per volt of supply variation as shown in the following equation:SWPS030-E002.gif

Depending on frequency, the PSRR is defined in Table 5-23.

Table 5-23 Video DAC Power Supply Rejection Ratio

Supply Noise Frequency PSRR % FSR/V
0 to 100 kHz 1
> 100 kHz The rejection decreases 20 dB/dec.
Example: at 1 MHz the PSRR is 10% of FSR/V

A graphic representation is shown in Figure 5-11.

SWPS030-019.gifFigure 5-11 Video DAC Power Supply Rejection Ratio

To ensure that the DAC SFDR specification is met, the PSRR values and the clock jitter requirements translate to the following limits on vdda_dac (for the Video DAC).

The maximum peak-to-peak noise on vdda (ripple) is defined in Table 5-24:

Table 5-24 Video DAC Maximum Peak-to-Peak Noise on vdda_dac

Tone Frequency Maximum Peak-to-Peak Noise on vdda_dac
0 to 100 kHz < 30 mVpp
> 100 kHz Decreases 20 dB/dec.
Example: at 1 MHz the maximum is 3 mVpp

The maximum noise spectral density (white noise) is defined in Table 5-25:

Table 5-25 Video DAC Maximum Noise Spectral Density

Supply Noise Bandwidth Maximum Supply Noise Density
0 to 100 kHz < 20 V / Hz
> 100 kHz Decreases 20 dB/dec.
Example: at 1 MHz the maximum noise density is 2 / Hz

Because the DAC PSRR deteriorates at a rate of 20 dB/dec after 100 kHz, it is highly recommended to have vdda_dac low pass filtered (proper decoupling) (see the illustrated application: Section 5.10.4, External Component Value Choice).

5.10.4 External Component Value Choice

The full-scale output voltage VOUTMAX is regulated by the reference amplifier, and is set by an internal resistor RSET. IOUTMAX can be expressed as:

Equation 1. IOUTMAX = IREF /8 * (63 + 15/16)

Where:

Equation 2. VREF = 0.5V
Equation 3. IREF = VREF/RSET

The output current IOUT appearing at DAC output is a function of both the input code and IOUTMAX and can be expressed as:

Equation 4. IOUT = (DAC_CODE/1023) * IOUTMAX

Where:

Equation 5. DAC_CODE = 0 to 1023 is the DAC input code in decimal.

The output voltage is:

Equation 6. VOUT = IOUT *N* RCABLE

Where:

Equation 7. (N = amplifier gain = 21)
Equation 8. RCABLEΩ (cable typical impedance)

The TV-out buffer requires a per channel external resistors: ROUT1/2. The equation below can be used to select different resistor values (if necessary):

Equation 9. ROUT = (N+1) RCABLE = 1650Ω

Recommended parameter values are:

Table 5-26 Video DAC Recommended External Components Values

Recommended Value UNIT
CBG 100 nF
ROUT1/2 1650 Ω

In order to limit the reference noise bandwidth and to suppress transients on VREF, it is necessary to connect a large decoupling capacitor ©BG) between the tv_vref and vssa_dac pins.